Agilent Technologiesメーカー20ETの使用説明書/サービス説明書
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User ’s G uide Ag ilent T ech no logies 8719E T/20ET/22 ET 8 719ES/20 ES/22 ES Netw ork An alyzer s P art Nu mber : 0 872 0-90 392 Pr inte d in USA J u ne 2002 Sup e rse de s : F ebr uary 20 01 © Copyr i ght 1999–2 0 0 2 Agi lent T ec hnologies , Inc .
ii Notic e The i nf ormation conta ined in t hi s document is s ubject to change wit hout notice . Agilent T echnolog ies makes no w arranty of any kind with r egard to this material, inc luding but not limited to , the i mplied w arranties of m erchantabil ity and fitnes s for a partic ular purpose .
iii S afety N ote s The following safety notes are used throughout this m anual. F a mil iari ze yourse lf with each of the notes a nd its meaning before operat ing this instr ument. All p ertinent s afety notes for using this p r oduct ar e located in Cha p ter 8 , “Safety and Regulatory In form atio n.
iv Docu me ntation M ap The Installa tion an d Qu ick S tart Gu id e provides proc ed ures for installing , c onfiguring , a nd verifyi ng the oper a tion of the analyzer . It also will hel p you f a m iliariz e yourself wi th the basi c operati on of the a nalyz er .
Contents Contents-v 1. Making Mea surements Usi n g Thi s Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-2 More Instr ument Fu nctions Not De scrib ed in This Gu ide . . . .
Contents-vi Contents Usi ng Li mit Lin es to T est a D evice. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-72 Set t ing Up the Mea suremen t P arameter s . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-vii P erformi ng a P ower Met er (S ource) Ca libra tion Over the RF Ra nge . . . . . . . . . . . . . . . . 2-15 Sett ing th e Anal y zer to Make a n R Chann el Meas u rement . . . . . . . . . . . . . . . . . . . . . . . .2-17 High Dynamic Ra nge Swept R F/IF Con vers i on Loss .
Contents-viii Contents 4. Pri ntin g, P lott i ng, an d Sa vi ng M ea sur eme nt R e sul t s Usi ng This Chapt er . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4- 2 Pri nting or Plot ting Y our Measure ment Re s ult s .
Contents Contents-ix What Y ou Can Save to the A nal yzer’ s Inter nal Memor y . . . . . . . . . . . . . . . . . . . . . . . . . . 4-36 What Y ou Ca n Sav e to a Floppy Disk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-x Contents Inc reasi ng Dynami c Rang e . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5- 15 Incr ease t he T est P ort Input Po wer . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-xi Mat ched Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6 - 4 5 Modif y th e Cal Ki t Thru Defin itio n . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-xii Contents Swep t Lis t Fr equency Sweep (H z) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-17 P ow er S weep (dBm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Contents-xiii The TRL Cali brati on Proc edure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-7 2 GPIB O perati on . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents-xiv Contents.
1-1 1 Maki ng Measur ement s.
1-2 Making Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing example proc edures for making m ea surements . Mi xer and ti me domain measurement s are cov ered in Chapter 2 , "Ma king Mixer Measurements (Opt io n 08 9 Onl y)" and Chapter 3 , “Making Ti m e Domain Measurement s.
1- 3 Making Measur ements More I nstrument Fun ctions Not Described in This Guide More Inst rument Funct ions Not Describ ed in This Gui de T o learn abo ut instrument func tions not c overed in this user’ s guide , refer to the follow ing chapters in the refer ence guide .
1-4 Making Measurements Making a Basic Measur ement Making a Basic Meas urement There are f ive basic s teps when you are m aking a measurement. 1. Connect the d evice und er test a nd any requi r ed test eq uipment. CA UTI ON Damage m ay result t o the devic e under test (DUT ) if i t i s sensitive to the analyzer’ s default output power level.
1- 5 Making Measur ements Making a Basi c Measurement Set ting the Frequen cy R ange T o s e t the center frequency to 134 MH z, press: T o set the span to 3 0 MHz, press: NO TE Y ou could al so press the and keys and e nter the fr equency range limi ts as start f requency and s top frequenc y values .
1-6 Making Measurements Making a Basic Measur ement Step 5. Outpu t the measurement results . T o create a p rinted co p y of the measurement result s, p ress: (or ) Refer to Chapt er 4 , “Printi ng , Plotting , and Saving Measurement Results ,” for procedure s on how to set up a pri nter and defi ne a print, p lot, or save resul ts.
1- 7 Making Measur ements Measuring Magnitud e and Insertion P hase Response Mea su ring M agnitude an d Insertion Pha se Response This measurement ex amp le shows y ou how to meas ure the maximum amp.
1-8 Making Measurements Measuring Magni tude and Inser ti on Phase Response If the channels a r e coupled ( the default condition), this calib r ation is valid for b oth channels . 4. Reconnect your t est device. 5. T o better v iew the measurement tr a ce, press: 6.
1- 9 Making Measur ements Measuring Magnitud e and Insertion P hase Response Fi gure 1-4 E xample Insert ion Phase Re sponse M easurement The phase r esponse shown in Figu r e 1 -5 is undersample d ; that i s, t here is m ore than 18 0 ° phase del ay between fr equency points .
1-10 Making Measurements Using Di splay Funct ions Using Display Functions This sec tion provi d es the neces sary informatio n for using the displa y functions . These functio ns are ver y helpful for displayi ng measurement data so tha t it wil l be easy to r ead.
1- 11 Making Measur ements Using Displa y Functions Titling the Active Channel Display 1. Press to a ccess the title menu. 2. Press and enter the title y ou want for your measurement d isplay . • If you ha ve a DIN keyboard at tached to the analyzer , type the ti tle you want from the keyboard.
1-12 Making Measurements Using Di splay Funct ions Viewing Both Primary Measurement Channels In s om e cases , you may want to view more than one measured parameter a t a time . Simulta neous gain and pha se measurements , for e xample, are us eful in evaluating stabili ty in negati ve feedback a m plifi er s.
1- 13 Making Measur ements Using Displa y Functions Fi gure 1-8 Example Dual C hannel with Split Display On 3. T o re tu rn t o a sing le-g rati cul e d isp la y , p re ss : . NO TE Y ou can contr ol the sti m ulus funct ions of the tw o channels i ndependent of each other by pressing .
1-14 Making Measurements Using Di splay Funct ions However , there ar e two config ur ations tha t w ill no t sweep continuousl y . 1. F or analyzer s with source attenuators , with c hannel 1 ha ving.
1- 15 Making Measur ements Using Displa y Functions Figure 1 -9 Th ree-C han nel Di splay 4. Press Chan 4 ( or press , set to O N ). This en ables channel 4 and the screen now displays f our separate g rids as show n in Figu re 1-1 0 . Channel 4 is i n the lower -right quadr a nt of the s creen.
1-16 Making Measurements Using Di splay Funct ions Figur e 1-1 0 F our -C hann el Dis p lay 5. P ress . Observe that th e a mber LED adjacen t to the key is l it and the CH4 indicator on the dis play has a box around i t. This indica tes that cha nnel 4 is no w active and c an be configured.
1- 17 Making Measur ements Using Displa y Functions Once made active , a channel c an be confi gured independentl y of the other channel s in most variables except stim ulus. F or example , once channel 3 is active , you c an change its for mat to a Smith chart by p ressing .
1-18 Making Measurements Using Di splay Funct ions 4 P aram Disp lays S oft ke y The menu does two thing s : • provides a quick wa y to s et up a four -parameter disp lay • gives inf ormation for usi ng softkeys i n the menu Figu re 1-1 1 show s the f i rst screen.
1- 19 Making Measur ements Using Displa y Functions Using Memory T races and Memory Math Functions The analyzer has four a vailable memory tr aces , one p er channel. Memo ry traces are t otally channel dep endent: c ha nnel 1 cannot access the c hannel 2 memory trace or v ice versa.
1-20 Making Measurements Using Di splay Funct ions T o V iew th e Measure me nt Dat a and Mem ory Trace The anal y zer default s etting s how s you t he current measureme nt data for the active channel .
1- 21 Making Measur ements Using Displa y Functions Blanking the Display Pressing switches off the analyze r display while leav ing the instr um ent in i ts current measur ement state .
1-22 Making Measurements Using Di splay Funct ions Adjusting the Colors of the Display Setting Display Intensity T o adjust the intensi ty of the disp lay , pr ess and rotate the f ro nt panel knob , us e the ( ) ( ) keys , or use the numeric al keyp ad to s et the intensity value between 50 and 1 00 per cent .
1- 23 Making Measur ements Using Displa y Functions NO TE Ma ximum viewi ng with the LCD displa y is achieve d when primary color s or a combination o f t hem are sel ec ted at ful l brig htnes s ( 100%). T abl e 1-2 lists the recommended color s and thei r correspondi ng tint numbers .
1-24 Making Measurements Using Marker s Using Markers The key disp lays a m ov able activ e marker on the screen and p r ovides ac c ess to a serie s of menus to control up to five displa y m arkers for each channe l. M ark ers are used to obtain numerical rea d ings of m easured values .
1- 25 Making Measur ements Using Markers NO TE U sin g wil l als o af fect mar ke r sea rch and positi oning functions w hen the v a lue enter ed in a s earch or position ing function does not exist a s a measurement p oint. The marke r will be positioned to the clos est adjacent p oint that sa tisfies the s e arch o r po si tion in g va lu e.
1-26 Making Measurements Using Marker s Fi gu re 1-13 Active and Inactive Mark e r s E xamp le • T o switch of f all of t he m arkers , press . T o Mo ve Marker Inform ation Off the Grids If m a rke.
1- 27 Making Measur ements Using Markers Figure 1 -14 M arker In forma t ion M o ved int o the S oftk ey Menu Are a 4. Restore the s oftkey menu and move the marker inf or mation back onto the gra ticules: Pre ss . The di splay wi ll be sim ilar t o Fig ure 1-1 5 .
1-28 Making Measurements Using Marker s Fi gu re 1-15 Marker Informati on on the Gratic u les Y ou ca n also restore the s of tkey menu by pressi ng a hardkey which opens a menu (such as ) or p ressing a sof tkey .
1- 29 Making Measur ements Using Markers Figure 1 -16 M arker 1 a s the Referen ce M arker E xam ple 4. T o c hang e the reference marker to mark er 2, p res s : T o Activate a Fixed Mar ker When a ref er ence marker i s fixed, it does not rely on a c urrent t r ace to m a intain i ts fixed position.
1-30 Making Measurements Using Marker s Fi gu re 1-17 Exampl e of a Fixed Reference Marker Using MKR ZE RO Using the Key to Activate a F ixe d Referen c e Marker 1.
1- 31 Making Measur ements Using Markers Fi gu re 1-18 Example of a Fixe d Reference Marke r Using ( ∆ )REF=( ∆ )FIXED MK R T o Couple and Uncouple Display Markers At a preset state , the markers ha ve the sa m e stimulus val ues on eac h channel, but they can be uncoup led so that each channe l has independent markers .
1-32 Making Measurements Using Marker s T o Us e P olar F ormat Markers The anal yzer can dis play the mar ker value as magnitude and phas e, or as a real/i maginary pa ir: gi ves l ine ar ma gnit ude a nd p hase , gi ves l og mag nit ude and phase , gives the r eal value fi r st, then the imaginary value.
1- 33 Making Measur ements Using Markers T o Use Smith Chart Markers F or greater a ccuracy when us ing markers in t he Smith c hart format, a ctivate the discrete mark er mo de.
1-34 Making Measurements Using Marker s Fi gu re 1-21 Exampl e of Impedance Smith C hart M ar k ers T o Set Measur ement P a rameters Using Ma rkers The anal y zer allows you to set m ea surement parameter s with the m arkers , without g oi ng throug h the usual key s equence .
1- 35 Making Measur ements Using Markers Setting the Stop Frequency 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the stop fr eq uency . 2. Press to change the stop freq uenc y value to the value of t he active mark er .
1-36 Making Measurements Using Marker s Fi gu re 1-24 Exampl e of Setting the Center Frequency Using a Marker Setting the F re quency Span Y ou can set the span equal to the spacin g between two markers . If yo u set the ce nter frequency before you s et the fr eq uency span, you will ha ve a bette r view of t he area of inter est.
1- 37 Making Measur ements Using Markers Figure 1 -25 Exam ple of Set ting the Frequen cy Span Using Mar k er Set ting the Display Refer ence V alue 1. Press a nd turn the f ront panel knob , or enter a value fro m the front panel keypad to p osition the m arker at the va lue t ha t you w a nt for the analyzer di s play refere nc e v alue.
1-38 Making Measurements Using Marker s 1. P ress . 2. Press and t urn the fr ont p anel knob , or enter a val ue from the fr ont panel keypad to p osition the marker a t a poi nt of interes t.
1- 39 Making Measur ements Using Markers T o Search for a Specific Amplitude These f unc tions place the marker a t an ampli tude-related point o n the t race. I f you s witch on t rack ing, the analyz er searches ev ery new trace for the ta r get point.
1-40 Making Measurements Using Marker s Fi gure 1-29 Example of Searching for the M in imum Amplitu d e Using a Marker Searching f or a T arget A mplitude 1. Press to a ccess the m a rker searc h m enu. 2. Press to mov e the active m a rker to t he target poi nt on the measurement tra c e.
1- 41 Making Measur ements Using Markers Searching for a Bandwidth The analyzer can automatical ly calcula te and display the bandwidth (BW :), center frequency ( CENT:) , Q, and loss of the device und er test at the center f requency .
1-42 Making Measurements Using Marker s T o Calculate the Statistics of the Measurement Data This func tion calc ulates the mean, s tandard devi a tion, and p eak -to-pea k values o f the secti on of the displa yed trace between the activ e mark er and t he delta referenc e.
1- 43 Making Measur ements Measuring Electrical Length and Ph ase Distortion Mea su ring E lectrical Length an d Phase Distor tion Elec trical L eng th The analyzer mathematically implements a func ti on simila r to the m echa nica l “line stretc hers” of ea r lier analy zers.
1-44 Making Measurements Measuring Electri cal Length and P hase Disto rtion Y ou ma y also w ant to se lect setting s for the num b er of data p oints , a v eraging , and I F bandwidth. 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4.
1- 45 Making Measur ements Measuring Electrical Length and Ph ase Distortion The measur em ent value tha t the ana lyzer displa y s repres ents the electr ical leng th of your d ev ice relati ve to the speed of lig ht in free space . The p hysical leng th of your dev ice is related to this value by the propagation velo city of its medium.
1-46 Making Measurements Measuring Electri cal Length and P hase Disto rtion Deviati on F rom Line ar Phase By adding electric a l length to “flatten out ” the phase respo ns e, y ou have removed the line ar phase shift through y our device . T he deviati on from l inear phase shif t throug h your devic e is all that remains .
1- 47 Making Measur ements Measuring Electrical Length and Ph ase Distortion The default apertur e is the total f requency span divided by the number of points across the display (i.
1-48 Making Measurements Measuring Electri cal Length and P hase Disto rtion Fi gu re 1-38 Group Delay Example Measurement wit h Smoothing 5. T o increase the ef fective gr oup delay aperture , by inc.
1- 49 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) Ch ara cterizin g a Duplexer (E S Analyz ers Only) This measurement ex amp le demons tr ates how to characteri ze a 3-port d ev ice , in this case a duplexer , using f our- parameter di s play mod e.
1-50 Making Measurements Characterizi ng a Duple xer (ES A nalyzers Onl y) 3. Set up cha nnel 1 f or the Tx - Ant stim ulus para meters ( st art/stop f r equency , power level, IF bandwidth ). In t his example , a wide f requency range t hat cover s both the Tx-Ant a nd Ant-Rx paramete rs has been c hosen.
1- 51 Making Measur ements Characterizing a D uplexer (ES Anal yz ers On ly) 15.Set up a 2-gratic ule, 4 -parameter dis p lay with tr ansmission meas ur ements on the top grati c ule and r ef lecti on m easurements on the bottom gra ticule: Pre ss , then s et to .
1-52 Making Measurements Measuring Ampl if iers Measur in g Amplifi ers The anal y zer allows you to measure the transmissi on and reflec ti on chara c teristics of many ampli fier s and a c tive d ev ic es .
1- 53 Making Measur ements Measuring Ampli fi er s Measuring Gain Compr ession Gain compress i on occurs w hen the inp ut power of an am plifier is increased to a level t hat reduces the gain of the a mplifier and causes a nonl i near increa s e in output power .
1-54 Making Measurements Measuring Ampl if iers 4. T o produce a nor m alized tra ce that repres ents gain compr ession, perfor m either step 5 or step 6 . (Step 5 uses trace ma th and ste p 6 uses uncoup led channels and the di s play function .) 5. Press to p r oduce a normali zed trace .
1- 55 Making Measur ements Measuring Ampli fi er s Fi gure 1-44 Gain Compression Using Linear Sweep and 12.If w a s selected , recouple the channel stimulus by press ing: 13.T o place t he marker exact ly on a measurement point, press: 14.T o set the CW frequency bef ore going int o the power s w eep mode, press: 15.
1-56 Making Measurements Measuring Ampl if iers NO TE A receiver c alibration w ill improve the a ccuracy of thi s measurement. Ref er to Chapter 6 , “Cal ibrating f or Increased Mea surement Ac c uracy .
1- 57 Making Measur ements Measuring Ampli fi er s Measuring Gain and Reverse Isolation Simultaneously (ES Analyzers Only) Since a n amplifie r will ha v e high g ain in the fo rward dir ec t io n an d h ig h isol atio n in the reverse d irection, the gain (S 21 ) will b e much grea ter than the r everse isol ation (S 12 ).
1-58 Making Measurements Measuring Ampl if iers Fi gu re 1-46 Gain and Reverse Isolat ion.
1- 59 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 085 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 085 can b e configured t o m easure high p ower devices .
1-60 Making Measurements Measuring Ampl if iers 5. Switch on the booster amplifier . 6. Using a pow er meter , measure the output power from the coupled ar m and the open port of the coupler . NO TE Depending on the power meter being us ed, addit iona l attenuation may ha ve to be added between the c oupler port a nd the power m eter .
1- 61 Making Measur ements Measuring Ampli fi er s Fi gure 1-48 High P ower T est Setup (Step 2a) Fi gure 1-49 High P ower T est Setup (Step 2b ) Selec ting P ow er Ran ges and Att enu ator Setting s 14.Selec t a p ow er r a nge that will not exc eed the maximum estim a ted power l evel t hat will force the DUT into com p ression.
1-62 Making Measurements Measuring Ampl if iers 16.Estimate the maxi m um amount of gain that could be provided b y the DUT and, a s a result, the maximum amount of p ower that c ould be recei ved by TEST PORT 2 wh en the DUT is in compressio n.
1- 63 Making Measur ements Measuring Ampli fi er s Wi th the previous poin ts in mind, t he amount of attenua ti on can be calcul a ted f rom the fol lowing equations: • Attenuator A = +20 dBm − 13 dB − ( − 10 d Bm). At tenuator A = +1 7 dB • Attenuator B = +30 dBm − 13 dB − ( − 10 dBm) .
1-64 Making Measurements Measuring Ampl if iers Fi gu re 1-51 High P ower T est Setup (Step 3) 26.Make any other desired high p ow er measurement s. Ratio measurement s suc h a s gain w i ll be c orrectly displayed . However , the displaye d absolute p ow er levels on the analyzer will not b e correct.
1- 65 Making Measur ements Measuring Ampli fi er s Making High P ower Measuremen ts with Option 012 (ES Analyzers Only) Analyzers eq ui pped with Opt ion 012 can b e configured t o m easure devi c es that have high power outputs .
1-66 Making Measurements Measuring Ampl if iers With the p re vious points i n mind , the a mount of att enuation c a n be ca lc ul ated f r om the following equati ons : • Attenuator v a lue = +2 0 dBm − 13 dB − ( − 10 dBm). A tten ua tor V a lue = +17 dB 3.
1- 67 Making Measur ements Using the Swept List M ode to T est a De vice Using t he Swept List Mode to T est a Dev ice When using a l ist frequenc y sweep, the analyzer has the abili ty to sweep a rbitrary frequency seg ments, each co nta ining a l ist of freq uency points .
1-68 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 2. Set the f ollowing meas ur ement parameters: or on ET model s: Observe the Characteristics of the F ilter Fi gu re 1-55 Characteristics of a Fi lter • Generally , the passband of a fil ter exhibits l ow loss.
1- 69 Making Measur ements Using the Swept List M ode to T est a De vice Set Up the Lower Stopband P arameters 3. T o set up the segment f or the l ow er stopband, press 4.
1-70 Making Measurements Using the Swept Li st Mode t o T est a Devi ce 8. T o maximize the dynami c range i n the stopband (increasing t he incident p ow er and narrowing t he IF bandwidth) , press: 9. P ress . Calibrate and Measure 1. Remove the D UT and perform a ful l two-por t calibration.
1- 71 Making Measur ements Using the Swept List M ode to T est a De vice Fi gure 1-57 Fil ter M easurements Using Linear Sweep and Swept List Mode (P ower: 0 dBm/I F BW : 3700 Hz) Using Linea r Sweep .
1-72 Making Measurements Using Limit Lin es to T est a D evi ce Using Lim it Li nes to T est a Dev ice Limit testi ng is a measur ement technique that compa res m eas urement data to constraints that y ou define. Depending on the results of this c om parison, the analyzer will indicate i f your d evice eit her passes or f ails the test.
1- 73 Making Measur ements Using Limi t Lines to T est a Device 3. Substitute a thr u for the device and per form a response c alibration by pressing: 4.
1-74 Making Measurements Using Limit Lin es to T est a D evi ce 5. T o terminate the flat l i ne segment by establishing a single poi nt limit, p r ess: Figu re 1-59 shows the f lat limi t lines that .
1- 75 Making Measur ements Using Limi t Lines to T est a Device • T o crea te a limit line that t es ts the hi g h side of the bandpass f ilter , press: Fi gure 1-60 Example F lat Limit Lines Creating a Sloping Limit Line This example procedur e shows you how to make limits that test the shap e factor of a SA W filter .
1-76 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o access the limits menu a nd activate the limit li nes, press: 2. T o establi s h the start f r eque ncy a nd l imits f or a s l oping limit li ne that t es ts the low s ide of the fi lter , press: 3.
1- 77 Making Measur ements Using Limi t Lines to T est a Device Fi gure 1-61 Sloping Limit Lines Creating Sing le P oint Limits In this ex ample proc ed ure, the following limits ar e set: • from − 23 d B to − 28 .5 dB at 14 1 MH z • from − 23 dB to − 28 .
1-78 Making Measurements Using Limit Lin es to T est a D evi ce Fi gu re 1-62 Exampl e S i n gle P oints Limit Line Editing Limit Segments This e xa mple shows you how to edit the upper lim it of a li m it line . 1. T o access the limits menu a nd activate the limit li nes, press: 2.
1- 79 Making Measur ements Using Limi t Lines to T est a Device Running a Limit T est 1. T o acce s s the lim its menu and acti vate the limit l ines , press: Reviewing the Limit Line Segments The limit ta ble data tha t you ha ve previousl y entered is shown on the anal yzer display .
1-80 Making Measurements Using Limit Lin es to T est a D evi ce 1. T o offset a ll of the segm ents in the limit ta ble by a fi xed frequency , (for ex a mple, 3 M H z ), pre ss: The analy ze r bee ps an d a FAIL n otation appears on the analyzer displa y , as shown in Figu re 1-63 .
1- 81 Making Measur ements Using Ripple Limits to T est a Device Usin g Ripple Limit s to T est a Device Setting Up the List of Ripple Limits to T es t Two tasks ar e involved in p reparing f or ripple t esting: • First, s et up the a na lyzer setti ng s to v iew the freq uenc y of i nterest.
1-82 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-65 Conne ctions for an Example Ripple T e st Measurement 2. Press and c hoose the measurement s ettings .
1- 83 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-66 Filt e r P ass Band Before Ripple T est Setting Up Limits for Ripple T esting This sect ion instructs you on setti ng up the r ipple test parameters.
1-84 Making Measurements Using Rippl e Limits to T est a Device 1. T o access the ripple te s t menu, press: 2. T o access the ripple te s t edit m enu, press . 3. Add the f i rst fr eq uency band ( Frequency Band 1 ) to be tes ted by press ing . 4. Set the l ower frequency value of F requency Band 1 b y pressing: 5.
1- 85 Making Measur ements Using Ripple Limits to T est a Device 3. Mak e the cha ng es to the selected b a nd by press i ng: a. and the new value t o change the l ower frequency of the frequency b a nd. b . and the new value to cha nge the upper frequency of t he frequency b a nd.
1-86 Making Measurements Using Rippl e Limits to T est a Device Dele ting Exis ting Freq uency B and s Frequ ency band limits m ay be del eted for testi ng the ripp le.
1- 87 Making Measur ements Using Ripple Limits to T est a Device Fi gure 1-67 Filt e r P assband with Ripple T e st Activat e d As the analyze r measures the ripple, a message is di splayed ind i cati.
1-88 Making Measurements Using Rippl e Limits to T est a Device • If the r ipple t est fails , the ripple limits a re drawn on the displa y for each f requency band.
1- 89 Making Measur ements Using Ripple Limits to T est a Device T o di splay t h e rippl e va lue, press . Pressin g this soft ke y tog gle s between , , and . from the Ripple T est Menu until ON is display ed on the softkey . Pressing this s oftkey toggle s the anal y zer between r ipple test o n and rippl e test off sta tus.
1-90 Making Measurements Using Rippl e Limits to T est a Device Fi gu re 1-69 Filter P ass B and with Absolute Ripple V alue for Band 1 Activated View ing the Ripple V alue in Margin Format When is select ed, the mar gi n by whic h the r ipp le v alue p assed or fa iled is d isplayed.
1- 91 Making Measur ements Using Ripple Limits to T est a Device Figu re 1-70 shows the r ipple test with margin r ipple value d isplaye d for Fr equency Band 2. Notic e that Frequ ency Band 2 passes t he ripple test with a ma rgin of 0.097 dB . The plus s i gn ( + ) indicates thi s band p asses the ri pple test b y the amount displayed.
1-92 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Usi ng Bandwi dth Li m it s to T est a B andpass Fi lter The bandwid th testing mode c an be used to test the ba nd width of a bandpass filt er .
1- 93 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-72 Connections for a Bandp ass Filter Example Measu reme nt 2. Press and choo s e the measur em ent setti ngs. F or this exa m ple, the measurement setti ngs are as fol low s: a.
1-94 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter 3. Substitute a thru f or the dev i ce and perfor m a response c alibration b y pressing : 4.
1- 95 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Activating the Bandwidth T est 1. Start the band w idth test b y pressing the s of tkey until ON is displaye d. The bandwid th test co ntinues to run unti l the softkey is ret ur ned to the OF F position.
1-96 Making Measurements Using Band widt h Limit s to T est a Bandpass Filter Fi gu re 1-75 Band widt h Markers Placed 40 dB Below the Bandpass P eak Displa yin g the B andw idth V alue 1. Display the bandwidth v a lue by pres s ing the softkey until ON is dis p layed on the softkey .
1- 97 Making Measur ements Using Band widt h Limit s to T est a Bandpass Filter Fi gure 1-76 Filt e r P ass Band with Bandwid th V alue Displayed.
1-98 Making Measurements Using T est Sequencing Using T est Sequencing T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key .
1- 99 Making Measur ements Using T est Sequenci ng Figure 1 -77 T e st Seq uencing He lp Ins truction s 2. T o selec t a sequence p osition in w hich to stor e your sequence , pres s: This cho i ce select s sequence posi tion #1. The d efault ti tle is SE Q1 for this sequence.
1-100 Making Measurements Using T est Sequencing The previous key strokes wi ll create a displayed l ist as show n: Start of Sequence RECALL PRST STAT E Tran s: FWD S 21 (B/ R) LOG M AG CENTER 13 4 M/u SP AN 50 M/u SC AL E/DIV A UTO S CAL E 4.
1- 101 Making Measur ements Using T est Sequenci ng 3. T o move the c ursor to the command that yo u w ish to d elete, press: or • If you wi sh to scroll through the s equence wit hout executing each line as you do so , yo u can pr ess the key an d scroll thro ug h t he com m an d l ist ba ckward s.
1-102 Making Measurements Using T est Sequencing The foll ow ing li s t is the c ommands entered i n "Creating a Sequence" on page 1-98 . Notice t hat for long er sequences , only a po r tion of the list c an appear on the screen at one time .
1- 103 Making Measur ements Using T est Sequenci ng Changing the Sequence T itle If y ou are storing s equences on a disk, you should replac e the default titles (SEQ1, SEQ2, …) . 1. T o selec t a sequence tha t you wa nt to retit le, p ress: and s elect the p articul a r sequence s oftkey .
1-104 Making Measurements Using T est Sequencing Storing a Sequence on a Disk 1. T o fo rm at a di sk, re fe r t o Chapter 4 , “Printing , Plotting , and Sav ing Measurement Results .” 2. T o save a s equence to the interna l disk, press: and selec t the parti cular sequence s oftkey .
1- 105 Making Measur ements Using T est Sequenci ng Printing a Sequence 1. Confi g ure a compat ible printer to the analyzer . (Refer to th e “Options and Ac cessories” chap ter of the reference guid e.) 2. T o pri nt a sequence, p ress : and the sof tkey for the d esired sequenc e.
1-106 Making Measurements Using T est Sequencing Comm an ds Th at R equi re a C lean Swee p Many fr ont panel commands di s rupt the s weep in progres s, f or example , changing the channel or measurement type .
1- 107 Making Measur ements Using T est Sequenci ng NO TE P resetting the instrument does no t run the Auto Seq uence automatical ly . Gosub Sequence Command The softkey , l oc ated in the Sequencing menu, activates a feature that all ows the sequence to branch of f to anot her sequence , then r eturn to the or iginal sequence .
1-108 Making Measurements Using T est Sequencing The TESTSET I/O bits are set using the and keys under the key s . The v alues of the outputs (pins 1 1, 22, a nd 23) are des cri be d in T a ble 1- 5 .
1- 109 Making Measur ements Using T est Sequenci ng Electrica l specifi c ations f or TTL high: • vol ts(H) ≥ 2. 7 v olt s (V ) • current = 2 0 microamps ( µ A) Electrica l specifi c ations f or TTL low: • vol ts(L) ≤ 0. 4 vo lt s (V) • curr en t = 0.
1-110 Making Measurements Using T est Sequencing T e st Set Inter co nnec t Cont rol Fi gu re 1-79 T est Set Interconnect Pi n Designations Control of the ext er nal swi tch (8762B Option T24) can be d one through the test set inter face on the r ear panel of the analyzer .
1- 111 Making Measur ements Using T est Sequenci ng T able 1-5 T est Set Interconnect Pin Designation Pin Num ber Pin Desc ri ptio n Pin 1 No Connec tion (NC) Pin 2 S weep dela y: holds off sweeps unt.
1-112 Making Measurements Using T est Sequencing TTL Out Menu The softkey provides acc ess to the TTL out menu. This m enu allows you to choos e between the f ollowing output parameters of the TTL o utput signal: • • • • The TTL outp ut signals ar e sent to the s equencing BNC rear panel output.
1- 113 Making Measur ements Using T est Sequenci ng Loop counter decision making The anal y zer ha s a numeric r egister c alled a l oop counter . The value of this r egister ca n be set by a s equence , and it can b e incriminated or decremented ea ch ti me a sequence repeats itself .
1-114 Making Measurements Using T est Sequencing t o T est a Devi ce Using T est Sequencing t o T est a Device T est se quenci ng a llows you to automate r ep eti ti ve tasks . As you m ake a m easur ement, the analyzer m emorizes the key strokes . Later you can repea t the enti re sequence b y pressing a singl e key .
1- 115 Making Measur ements Using T est Sequenci ng to T est a Device The fol lowing seque nc es will be created: SEQUE NCE SEQ1 Start of Se que nc e CENTE R 134 M /u SPAN 50 M/u DO SEQUE NCE SEQUE NC.
1-116 Making Measurements Using T est Sequencing t o T est a Devi ce T o create a second sequence that will perform a d esi re d measurement function, decre m ent the loop counter , and call i tself u.
1- 117 Making Measur ements Using T est Sequenci ng to T est a Device This will c reate the f ollowing di s played l ists: Start of Sequence LOOP COUNTER 7 x1 INTERNAL DISK DATA ONLY ON DO SEQUENCE SE.
1-118 Making Measurements Using T est Sequencing t o T est a Devi ce • The plot fi le names gene r ated by th is sequence will be: PL00007.FP through PL00001.
1- 119 Making Measur ements Using T est Sequenci ng to T est a Device This wil l create a displayed l ist for seq uence 2, a s shown: Start of Se que nc e INTER NAL DI SK DATA ARR AY ON FILEN AME FILE 0 SAVE FIL E 3.
1-120 Making Measurements Using T est Sequencing t o T est a Devi ce.
2-1 2 Ma king Mixe r M easur ement s (Optio n 089 Only).
2-2 Making Mix er Measurements (Option 089 Only) Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • Information on mixer measuremen t capabiliti es.
2- 3 Making Mixer Measurements (Option 089 Only) Mixer Measur ement Capabili ties Mixer Measurement Capab ilit ies The analyzer is capable o f measuring t he following m ixer (frequenc y converter ) p.
2-4 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Measurement Cons iderations In mixer transmission meas ur ements , you ha ve RF and LO inputs a nd an IF outp ut. Also emanati ng f rom the IF port are several other mixing products of the RF and L O signals .
2- 5 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-2 Conversion Loss versus Output F re quency without At ten uat ors at Mixer P orts Fi gu re 2-3 Examp le of Con.
2-6 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Eliminating Unwanted Mixing and Leakage Signals By pla c ing fil ters between t he m ixer’s IF port and the receiver’s input por t, you can eli mi nate unw a nted mixing a nd leakage si g nals from e ntering the ana lyzer’s rec eiver .
2- 7 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Fi gu re 2-5 Examp le of Conversion Loss versus Output F reque ncy with Correct IF Signal P ath Filterin g an d Attenuat i.
2-8 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Figure 2 -6 Exam ples of U p C onvert ers a nd Dow n Co nverte r s In s ta ndard mixer m easurements , the i np ut of the.
2- 9 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Figu re 2-7 D own Con ver ter P o rt Co nnec tion s • In an up co nv erter measur em ent where the softkey is selected ,.
2-10 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons Frequ ency offset meas urements do no t begin until all of the f requency off set mode parameters are set.
2- 11 Making Mixer Measurements (Option 089 Only) Measuremen t Consider ations Setting the power r a nge to manual prevents the i nternal sour c e attenuato r from switchi ng when changi ng power level s.
2-12 Making Mix er Measurements (Option 089 Only) Measurement Consi der ati ons 6. Y ou ca nnot trust R c hannel power se ttings without know ing about the offset inv olved.
2- 13 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Convers ion Loss U sin g the Frequency Of fset Mode Conversio n loss is the m easure of ef f ic i ency of a mix er . It is the ra tio of si d e-ba nd IF power to RF sig na l power , and is us ually expr essed in dB .
2-14 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting Measurement P arameters for the P ower Meter Calibration 1.
2- 15 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode P erforming a P ower Meter (Source) Calibration Over the RF Range 1. Calibrate and zero the power m eter . 2. Set the power m eter’s a d dress: (where aa is the GPIB address of the power mete r ) 3.
2-16 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o perform a one sweep power meter c alibration o ver the RF frequency range at 0 dBm ( − 10 .
2- 17 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode Setting the Analyzer to Make an R Channel Measurement 1.
2-18 Making Mix er Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 4. Turn on freq uency offset op eration b y pressing . Notice in thi s high-s ide LO , down convers ion configura tion, the analy zer’s sourc e is actually s weeping b a ckwards , as shown in Fi gur e 2 -13 .
2- 19 Making Mixer Measurements (Option 089 Only) Con version Loss Using t he Frequency Of fset Mode 5. T o view t he conversion loss in the b est verti cal resoluti on, press . Fi gu re 2 -15 Conversion Los s Example M easurement In this measurement , you set the input power and measured the outp ut power .
2-20 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Hig h Dynamic Ran g e Swept RF/IF Co nversion Loss The frequenc y of f set mode ena bles the testi.
2- 21 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Figur e 2-16 C onne ctions f or P ow er Mete r Calib ration 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the power m eter’s a d dress: (where aa is the p ow er meter GPIB a ddress) 5.
2-22 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss NO TE Because power me ter c al ibrati on r eq uir es a l onger sweep ti me, you m a y w a nt to reduce the number of points before pressing .
2- 23 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Using the Mixer Measurement Diagra m While the a nalyzer is s till set to the IF f requency rang e, pres s : Note the RF frequency val ues on the diagram.
2-24 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss P erform the High Dyna mic Range Measur ement 1. Return the analyzer to t he IF fre q uency range. Press . 2. Make the connec tions shown i n Fig ure 2- 19 3.
2- 25 Making Mixer Measurements (Option 089 Only) High D ynamic Range Swept RF/IF C onver sion Loss Fi gu re 2-19 Conn ection s for a H igh Dynamic Range Swept IF Conversion Loss Measurement 4. Set the anal yzers LO frequenc y to match t he frequency of the LO sou r ce by press ing: 5.
2-26 Making Mix er Measurements (Option 089 Only) High Dynamic Rang e Swept RF/IF Con ver si on Lo ss Fi gure 2-20 Example of Swept IF Convers ion Loss Measure me nt.
2- 27 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Fi x ed IF Mixer Measur ements A fixed IF can be pr oduced by using b oth a swept RF a nd LO that a re offs et by a certa in frequency . With p roper fil tering , only this offset f requency wil l be present a t the IF port of the mixer .
2-28 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements NO TE Y ou may have to cons ult the us er ’s guide of the ext er nal source being used t o determine how to set the source t o receive SCPI c ommands.
2- 29 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Putting the A nalyzer into Tu n ed Receiver Mod e Setting Up a Frequency List Sweep of 26 P oints P erforming a Response C.
2-30 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Initializ in g a Loop Counter V alue t o 2 6 Ad dres s ing a nd C onfi gurin g t he T wo Sou rc es Input as title: F REQ :.
2- 31 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements TUNE D RE CEI VE R EDIT L IST ADD CW FR EQ 100M /u NUMB ER OF P OI NTS 26x1 DONE DONE LIST F REQ B TITL E POW: LE V 6DB M .
2-32 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements Sequence 2 Setup The fol lowing seque nc e makes a seri es of measurements until all 26 CW measurements are made a nd the l oop counter value is equal to zero.
2- 33 Making Mixer Measurements (Option 089 Only) Fixed IF Mixer Measurements Press and the analyzer will displ ay the foll owing sequence c omma nds: SEQU ENCE SE Q2 Star t of Sequ ence WAIT x 1 x1 M.
2-34 Making Mix er Measurements (Option 089 Only) Fixed IF Mixer Measurements When the sequen ces are fini shed you should ha ve a r es ult as show n in Figu re 2-23 . Fi gure 2-23 Example Fixed IF Mixer Measu re men t The disp layed trace represents the conversion l oss of the mixer at 26 p oints .
2- 35 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Ph ase or Gr oup Dela y Measu rements F o r i nfo rm atio n o n gr oup de lay p rin c ipl e s, refer to "Settin g the Electri cal Delay" on page 1-37 .
2-36 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements An importa nt character istic to r em ember when sel ec ting a c alibrati on m ixer is that the dela y of the devi ce should b e kept as l ow as possib le. T o do this , se lect a mixer w ith very wide bandw idth (wider band w idth results in smaller delay).
2- 37 Making Mixer Measurements (Option 089 Only) Phase or Gro up Delay M easurements Fi gu re 2-24 Connections for a Group Delay Measur e ment 6. T o selec t the converter type and a high-si d e LO measurement conf iguration, press: 7. T o view t he measurement resul ts on the a na lyzer’ s displa y , press: 8.
2-38 Making Mix er Measurements (Option 089 Only) Phase or Grou p Delay M easurements 10.Replace the "c alibra tion" mixer w ith the dev ice under tes t. If measuring group dela y , set the dela y equal to the "calibr ation" mixer d elay (fo r example − 0.
2- 39 Making Mixer Measurements (Option 089 Only) Amplitude a nd Phase T racking Amp litude and Phase Tracking The match b etween mixers is defined as t he absolute di fference i n amplitude or p ha se response over a spec ifi ed frequ ency range .
2-40 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode Co nv er sio n C o mp r es sio n U si ng th e Freq u enc y O ffs et Mo de Conver s ion compress ion is a measure of the maximum RF i np ut signal level where the mixer p rovides l inear operati on.
2- 41 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode 4. T o set the analy zer to the d esired power swe ep range, press: 5.
2-42 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode 8. Make the connec tions as shown in Fi gur e 2 -29 . CA UTI ON T o prevent connec tor damage, use an adap ter (part number 1 250-1462) as a connector saver for R CHANNEL IN .
2- 43 Making Mixer Measurements (Option 089 Only) Con version Compression U sing the F r equency Of fset Mode The measurements setup diagram i s shown in Figure 2-3 0 . Fi gu re 2-30 Measu r e ment Setup Diagram Shown on Analyzer Display 12.T o view the mixer’s outp ut power as a f unc tion of its i nput power , press: 13.
2-44 Making Mix er Measurements (Option 089 Only) Con version Compression Using the Frequency Off set M ode The measurement r esults show the mixer’s 1 dB c om pression p oint. By changing the target value , yo u can eas ily lo cate other compress ion poi nts (for example , 0.
2- 45 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements Isolatio n Examp le Measu rements Isolati on is the m easure of s ignal le a kage in a mixer . F eedthroug h is specifi c ally the f or ward signa l lea kag e to the IF po r t.
2-46 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents 4. Make the connec tions as shown in Fi gur e 2 -33 . Fi gure 2-33 Connections for a Response Calibrat ion 5. P erform a resp onse calibrat ion by pressi ng . NO TE A full 2-port cali bration will increase the acc uracy of isolati on measurements .
2- 47 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements 7. T o adjus t the di s play sc ale, p ress: The measur em ent results show the mixer’ s LO to RF isol ation.
2-48 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents NO TE Isolatio n is dependent on L O power leve l and frequency . T o ensure good tes t result s, y ou should ch oose these pa r ameters as c lose to ac tua l opera ting condit ions as possib le.
2- 49 Making Mixer Measurements (Option 089 Only) Isolatio n Example Measurements NO TE Y ou may see spurious responses on the anal y zer trac e due to inte rference caused by L O to IF l eakage in the m ixer . This can be r educed with a veraging or by r educing the I F bandwidth.
2-50 Making Mix er Measurements (Option 089 Only) Isolat ion Example Measur em ents SWR / Return Loss Refl ect ion coeffi cient ( Γ ) is d efined as the ratio betwe en the refl ec ted volta ge (V r ) and inc ident voltage ( V i ).
3-1 3 Ma king T i me Domai n Meas urements.
3-2 Making Tim e Domain Measurements Using This C hapter Using This C hapter This cha pter contai ns the foll owing: • An intro d uction to time domain measurements • Example proced ur es for m a .
3- 3 Making Time D o main Measurements Intr oduction to Time D omain Measur ements Introdu ction t o Time Domain Measu rement s The analyzers with Option 010 all ow y ou to measure the time domain response of a device . Time domain a na lysis is us eful for isolating a device p roblem in ti me or i n distance .
3-4 Making Tim e Domain Measurements Int roduction t o Time D om ain Measurements Fi gure 3-1 Device Frequency Domain and Ti me Domain Reflection R esponses The time domain measure ment shows the ef f.
3- 5 Making Time D o main Measurements Making T ransmission Response Measurements M aki ng Tr an smission R esponse Me asurem e nts In this ex ample measurement there are thr ee components of the transmissi on response: • RF leakage at ne ar zero time • the main trav el path thro ugh the device (1.
3-6 Making Tim e Domain Measurements Making T ransmission Response M easurements 5. T o transform t he d ata f r om the f requenc y domai n to t he time domai n and set the sweep from 0 s to 6 µ s , press: The other ti me domain modes , low pass step and l ow pass impulse, ar e descr i bed in "Time Domain Low P ass Mode" on p age 3-15 .
3- 7 Making Time D o main Measurements Making T ransmission Response Measurements 11.T o activat e the gating f unction to r em ove any unwanted responses , press: As show n i n Figu r e 3-4 , only respons e from the main path is disp layed.
3-8 Making Tim e Domain Measurements Making T ransmission Response M easurements Fi gure 3-5 Gate Shape • T o see the ef fect of the gating i n the frequenc y dom ain, pre s s: This pl aces the gated response in mem ory . Fi gur e 3 -6 shows the effect of remov ing the RF leakage and the tripl e travel s ignal path usi ng gating .
3- 9 Making Time D o main Measurements Making Reflection Response Measurements Making Reflection Re sp onse Measurements The time domain response of a reflecti on measurement is o ften compared with the time domain reflect ometry ( TDR) measurements .
3-10 Making Tim e Domain Measurements Making Reflection Response Measurements Figu re 3 -8 Devic e Re s p onse in the Frequency Domain 5. T o transform t he data from t he frequency do m a in to the time domain, p ress: 6.
3- 11 Making Time D o main Measurements Making Reflection Response Measurements 8. T o positi on the marker on t he reflecti on of inter est, press : and tur n the front p anel knob, or enter a v a lue from the front panel key pad .
3-12 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Ti me Doma in Bandpass Mode Thi s mo de is ca ll ed b and pass becau s e it wo rks with ban d-lim i ted de vic es. Trad it ional TD R requir es that the test device be able to op erate down to dc .
3- 13 Making Time D o main Measurements Time Domain B andpass Mode Fi gu re 3-10 A Re flec t ion Measu r e ment of Two Cables The ripples in reflec tion coeffi cient versus frequency in the frequency d omain measurement are caused by the reflections a t each connector "beati ng" against ea ch other .
3-14 Making Tim e Domain Measurements Time Do m ain Bandpass Mode Transmission Measurements Usin g Bandp ass Mode The bandp a ss mode can a l so transfo rm transmission m easurements to t he time domain. F or example, thi s m o d e can provide inf ormation about a surface acoustic w ave (SA W) filter that i s not apparent in the fre quency domain.
3- 15 Making Time D o main Measurements Time Domai n Lo w Pass Mode Time Domain Low P ass M ode This mode is used to simul a te a tr a ditional time domain refl ectometry (TDR) measurement. It provides i nformati on to determine the type of disc ontinuity ( resistive , capacitiv e, or i nductive) tha t is pr esent.
3-16 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Minim um Al lo wable Stop Freque ncies The lowest analyzer meas urement frequency is 5 0 MHz, ther efore for each value of n there is a minimum allowa b le stop f requency that c an be used.
3- 17 Making Time D o main Measurements Time Domai n Lo w Pass Mode The real format can also be used in the low pass impul s e mode , but for the best dyna m i c range f or simultaneous l y viewing large and small discontinuit ies, use the log magnitude fo rmat .
3-18 Making Tim e Domain Measurements Time Do m ain Low P ass Mode F ault Location Measurements Using Low P ass As desc ribed, the l ow pass mode ca n simulate t he T DR response of the tes t device. This resp ons e contains i nformation usef ul in deter mi ning the t ype of di s continuity pr esent.
3- 19 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-14 Low P ass Step Measurements of Com mon Cable F aults (Real For m at) Transmission Measurements in Time Doma in Low P a.
3-20 Making Tim e Domain Measurements Time Do m ain Low P ass Mode Fi gure 3-15 Time Domain Low P ass M easure m ent of an Amplifier Small Signal Transient Response Interpr e tin g the Low P ass Step .
3- 21 Making Time D o main Measurements Time Domai n Lo w Pass Mode Fi gu re 3-16 Transmission Measurements Using Low P ass Impulse Mode.
3-22 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Tr ansf orm in g CW Time Measurements int o the Frequency Domain The anal yzer can dis play the a mplitude and p has e of CW signals v ersus time .
3- 23 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Interpreti ng the F orward Tran sform Ho riz ont al Axis In a fr equency domain t r ansform of a CW time measureme nt, the horizont al axis is measured in uni ts of f requenc y .
3-24 Making Tim e Domain Measurements T ransfor ming CW Time Measurements in to the Frequenc y Domain Figure 3 -19 Sepa ratin g th e A mplit ude an d P hase Comp onen ts of T est -Devic e-Ind uce d Mo.
3- 25 Making Time D o main Measurements T ransf or ming CW Time M easurements into the Frequen cy Domain Fi gu re 3-20 Range of a F orward T ransform Measurement T o increase the f requency domain m easurement range , increas e the span.
3-26 Making Tim e Domain Measurements Masking Masking Masking occurs when a discont inui ty (fault) c losest to the reference plane affects the resp ons e o f each subsequent dis continuity . This happens because the ener gy reflected f rom the f irst disconti nuity never reaches s ubsequent disc ontinuities .
3- 27 Making Time D o main Measurements Windowi ng Windowin g The analyzer provides a wind owing feature tha t makes time d om a in measurement s more useful for isolati ng and identif y ing individua l responses . Windowing i s needed bec a use of the abrupt t ransitions i n a frequenc y domain measur em ent at the sta rt and sto p frequencies .
3-28 Making Tim e Domain Measurements Window ing Choose one of the thr ee window shapes l isted or use the knob to s elect any windowing pulse width ( or ris e ti me for a step stim ulus) be tween t he soft key value s . The time domain stimul us sidelobe levels depend only on the w indo w selected.
3- 29 Making Time D o main Measurements Windowi ng Fi gu re 3-23 Th e Ef fects of Windowing on th e T ime Domain Responses of a S h ort Circ uit (Real F o r mat).
3-30 Making Tim e Domain Measurements Range Range In the time domain, r ange is d efined as t he length in time that a me asurement can be made withou t encounteri ng a repetition of the res ponse, c a lled a liasing .
3- 31 Making Time D o main Measurements Range In this ex ample, t he range i s 100 ns , or 30 meters el ectrical l ength. T o prevent the time domain resp onses from ove rlapping , the test device must b e 30 meters or less in e lectrical length for a transmiss i on measurement ( 15 meters for a reflect ion measurement).
3-32 Making Tim e Domain Measurements Resoluti on Resolu tion Two dif ferent resoluti on terms a re used in the ti me domain: • response res olution • range resoluti on Response Resolution Time do.
3- 33 Making Time D o main Measurements Resolution F or example, a cable wit h a teflo n dielectric (0.7 rel a tive veloc ity facto r ), measured und er the condit ions stated a b ove, ha s a fault l ocation measur em ent response r esoluti on of 0.45 centimeter s.
3-34 Making Tim e Domain Measurements Resoluti on Range Resolution Time domain r ange resol ution is def ined as the ability to locate a single response in ti me. I f only one r es pons e i s present, range resolution is a measur e of how c l os ely you can p i npo int the p ea k of t ha t response .
3- 35 Making Time D o main Measurements Gat ing Gating Gating pr ov ides the f lexibility of sele c tively re m oving time domain responses . The remaining ti m e domain resp onses can then be transformed b a ck to the f requency d om ain.
3-36 Making Tim e Domain Measurements Gat ing Fi gure 3-27 Gate Shape Selecting Gate Shape The four gate shapes available a re listed in T a bl e 3 -4 . Ea ch gate ha s a differ ent passband fl a tness, c utof f rate, a nd sidelobe levels . The passb and ripple and si delobe level s are descr iptive of the gate shape .
4-1 4 P rint ing, Pl ottin g, a nd Sa vin g Mea surement Results.
4-2 Printing, Pl otting, and S aving Measurement Resul ts Using This C hapter Using This C hapter This cha pter contai ns instructi ons for the following t a sks: • Printing or plotting y our measur.
4- 3 Printing, Pl otting, and S aving Measurement Resul ts Printi ng or Plo tting Y our M easurement Resul ts Printi ng or P lotti ng Y our Measur ement Result s Y ou c an print your m easurement resu.
4-4 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Function Co nf igu ring a Prin t Function All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power .
4- 5 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a Print Fu nct ion 3. Select one of the foll owing printer interfaces: • Choose if y our printe r has a GPIB i nterface , and then configure t he print func tion as f ollows: a.
4-6 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print F unct ion Defi ning a Print Fu nction NO TE The print d efinition is set to default values whenever th e power is cyc l ed. However , you can sa ve the pri nt definiti on by sav i ng the instr ument state.
4- 7 Printing, Pl otting, and S aving Measurement Resul ts Defi ning a Print Fu nct ion T o Reset the P rinting P arameters to Defa ult V alues 1. Pre ss .
4-8 Printing, Pl otting, and S aving Measurement Resul ts Printi ng One Measurement Per P age Printi ng One Meas u r ement P er P a ge 1. Configure and define t he print functi on, as ex plai ned in "Conf i guring a Print Functi on " on page 4- 4 an d "D efining a Print Function" on page 4- 6 .
4- 9 Printing, Pl otting, and S aving Measurement Resul ts Printi ng Multiple M easurements P er Page Printin g Mu lt iple Measurements P er P age 1. Configure and define the print f unct ion, as explaine d in "Configuri ng a Print Function " on page 4-4 and "Defining a Print Function " on page 4-6 .
4-10 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Configu rin g a Plot Fu nct ion All c opy configur ation setti ngs are stor ed in non- volatile memory . Therefore , they a re not affected if yo u press or switc h off the a nalyzer power .
4- 11 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion Informati on regarding a printer c ompatibil ity guide (an up-to-date l ist of pri nters that are c ompa tible wit h the network anal y zer) i s avail a ble i n "P rinti ng or Plotting Y our Measurement Res ults" on page 4-3 .
4-12 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function If Y ou Are Pl otting to a P en Plot ter 1. Press and then until ap pears. 2. Configure the analyzer for one of the f oll owing plotter i nterfaces: • Choose i f your p lotter has a GPIB interf ace, and then conf igure the p lot function a s follows: a.
4- 13 Printing, Pl otting, and S aving Measurement Resul ts Confi guring a P lot Fu nct ion If Y ou Are Plotting Measurement Results to a Disk Drive The plot files tha t yo u gen erate from the a nalyze r , conta i n the H PGL represent ation of t he measurement di s play .
4-14 Printing, Pl otting, and S aving Measurement Resul ts Confi gur in g a Plot Function Fi gu re 4-4 A ut om atic Fi le Naming Convention for LIF F ormat T o Output the P lot Files • Y ou ca n plot the f iles to a plotter from a personal c omputer .
4- 15 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Defining a Plot Function 1. Pre ss . Choosing Disp lay Eleme nts • Choose which of the foll owing measurement disp lay element s that you want to ap p ear on your plot: ❏ Choose if you want the measurement data trace to appear on your plot.
4-16 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function NO TE The peripheral ignores w hen you are p lotting t o a qua dra nt. Selecting P en Numbers and Colors • Press and select the plot el em ent where you w ant to cha ng e the pen num b er .
4- 17 Printing, Pl otting, and S aving Measurement Resul ts Defin ing a P lot Function Selecting Line Types • Pr ess and select ea ch plo t element line t ype that you w ant to modi fy . — Select to modify the line type for the dat a trace . Then enter t he new line ty pe (see Figure 4 -6 ), foll owed by .
4-18 Printing, Pl otting, and S aving Measurement Resul ts Defi nin g a Plot Function Fi gu re 4-7 Locations of P1 an d P2 in Mode Choosing Plot Speed • Press until the pl ot speed appea r s that you w a nt. ❏ Choose for normal plo tting. ❏ Choose for plott ing directly on transparenci es.
4- 19 Printing, Pl otting, and S aving Measurement Resul ts Plot ting One Measurement Per P age U sing a P en Plot ter Plot ting One Meas urement P er P a ge Using a P en Plot t er 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 .
4-20 Printing, Pl otting, and S aving Measurement Resul ts Plot ti ng Multi pl e Measur em ent s P er Page Using a Pen Pl otter Plottin g Mu ltiple Measurements P er P age Using a P en Plo tter 1.
4- 21 Printing, Pl otting, and S aving Measurement Resul ts Plottin g Multiple M easurements P er P age Using a P en Plotter If Y ou Are Plotting to a n HPGL Compatible Printer 1. Configure and d efine t he plot, as ex plained in " Conf ig uring a Plot Function" on pa g e 4-10 and "D efining a Pl ot Function" on page 4-15 .
4-22 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Files on a PC T o View P lot F i les on a PC Plot files can be v iewed and manipula ted on a PC usi ng a word proce s sor or g r aphics pres enta tion prog ram. Plot fi les contain a text s tr eam of HPGL (Hewlett- Pa ckard Graphics L anguage) c omma nds.
4- 23 Printing, Pl otting, and S aving Measurement Resul ts T o View Plot Fil es on a PC Using Ami Pro T o view plot files in Ami Pro, per form the f ollowing s teps: 1. From the FILE p ull-down menu, select IMPORT PICT U RE. 2. In the dialog box, change the File Type selecti on to HPGL.
4-24 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Pl ot Fi les fr om a PC to a Plot ter Converting HPGL Files for Use with Other PC Applications A util ity can c onvert hpgl (or .
4- 25 Printing, Pl otting, and S aving Measurement Resul ts Out putt i ng P lot Files f rom a PC t o an HPGL Compatibl e Pri nter Output t in g Plot Files from a PC to an HPGL Compa tible Pri nter T o output the p lot files to an HPGL compat i ble printer , you can use the HPGL initial ization sequence linked in a s eries a s follows: Step 1 .
4-26 Printing, Pl otting, and S aving Measurement Resul ts Outp utting Si ngle Pa ge Plots Usi ng a Pri nter Step 2. Store the exit HPGL mod e and form feed s equence. 1. Create a t est file b y typing in ea ch charact er as shown i n the left c olumn of T a bl e 4 -8 .
4- 27 Printing, Pl otting, and S aving Measurement Resul ts Outputt ing Mult iple P lots to a Singl e Pa ge Using a Printer Output t in g Multiple Plots t o a Single P age Usin g a Printe r Refer to &.
4-28 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Plottin g Mu ltiple Measurements P er P age from Disk The fol lowing procedur es show you how to store plot files on a LIF formatte d disk.
4- 29 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk T o Plot Multiple Measurements on a Full P age Y ou m ay want to plot v a rious fil es to the s a me page , for exampl e, to show measurement data traces for diff erent input s ettings, or para m eters , on the sa m e gratic ul e.
4-30 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multi pl e Measur ements P er Page fr om Disk Figu re 4-1 0 shows pl ots for bot h the frequenc y and time domai n r esponses of the same dev ice . Fi gu re 4-10 Plotting Two F iles on the Same P age T o Plot Measur ements in P age Quadrants 1.
4- 31 Printing, Pl otting, and S aving Measurement Resul ts Plot ting Multipl e Measurements Per P age f rom Disk 4. Press . The analyzer assigns the f irst available d efault f ilename for t he selec ted quadrant . F or example , the analyzer w ould assi g n PLOT01 LU if t here were no other lef t-upper quadrant p lots o n the disk.
4-32 Printing, Pl otting, and S aving Measurement Resul ts Tit li ng the Displa yed Measurement T itling the Dis played Measurement 1. Press to access t he title menu. 2. Press and enter the ti tl e you w ant for your measurement disp lay . • If you hav e a DIN keyboard attac hed to the analyzer , type the tit le you wa nt from the keyboard.
4- 33 Printing, Pl otting, and S aving Measurement Resul ts Configur ing t he Anal yzer to Prod uce a Time St amp Config uring the Analyzer to Produ ce a Time S t amp Y ou c an set a cl ock, and then activate i t, if yo u want the time and date to appear on y our hardcopies .
4-34 Printing, Pl otting, and S aving Measurement Resul ts Pri nti ng or Plotting the List V alues or Operati ng P arameter s Printing or Plot ting the List V alues or Operati ng Pa r a m e t e r s Press a nd selec t the informatio n that you w ant to appear on y our hardcopy .
4- 35 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Pr oblems with P rinting or Plot ting Solving P roblems w ith Printin g or Plotting If y ou encounter a p r oblem when you a re printing or plotti ng, c heck the fol lowing li s t for po ssi ble cau ses : • Look in the analyzer displa y message area.
4-36 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States Savi ng and R ecalli ng Instrument States Places Where Y ou Can Save • analyzer in ternal memory .
4- 37 Printing, Pl otting, and S aving Measurement Resul ts Savin g and Recalling Instrument States What Y ou Ca n Save to a Floppy Disk Y ou c an save a n instrument state and measurement results t o a disk.
4-38 Printing, Pl otting, and S aving Measurement Resul ts Savin g an Instrument State Saving an Instru ment State 1. Press a nd select one o f the storage d evices: ❏ ❏ ❏ connect an external disk drive to the analyzer ’ s GPIB connector , and co nf igure as f ollows: a.
4- 39 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving M easurement R esults Instrument states combined wi th measurements re s ults can only be saved t o disk. Fil es that conta in data-only , and the v arious sa v e optio ns avail a ble under the key , ar e also o n ly valid for disk saves.
4-40 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Fi gu re 4-13 Data P r oc essing Fl ow Diagram NO TE If the anal y zer has a n active two-p ort measurement cali bration, all four S-para m eters wil l be sav ed with the measurement resul ts.
4- 41 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If you sele c t , , or , the data is stored to disk i n IEEE-64 bit real format ( for LIF disks ), and 32 bit PC format for DOS disks . This ma kes the DOS da ta files ha lf the si ze of the LI F file s.
4-42 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s If , or , or is s elected, a CIT Ifile i s save d for eac h displa yed channel wi th the suffi x lett er “D”, or “F”, follo wed by a number . The number f ollowing “D” a nd “F” f iles is t he channel number .
4- 43 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s The "format" choice is selected b y the curr ent selectio n under the FORMA T menu.
4-44 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in T extu al (CSV) F orm T e xt u al mea sure m en t res ult s can b e save d in a co m ma-s e par ate d va lue (C S V ) fo rm a t a n d imported into a sprea dsheet applicat ion.
4- 45 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s How the A nalyz er Nam es T hese Files S equen tially When text fi les are sa ved, the ana lyzer generat es the file names automaticall y in the following format: txtcss.
4-46 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Saving in Grap hical (JP EG) F orm Graphical measurement results can be sav ed in JPEG format a nd used as a n illustr a tion in a text editor or desktop p ublishing a pp lication .
4- 47 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Instrument St ate Files When an instrume nt state is sa ved to a floppy disk, som e or all of the followi ng fil es may be p rod u ced .
4-48 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files with .d1 a nd .d2 Fil e Exte nsions There are tw o type of fi les with .d 1 and . d 2 file e xtensions . There i s Fil eXX .d1 ( or .d2) a nd Dat aX X .d 1 (o r .
4- 49 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Files w i t h .g0 File Extensio n FileXX.g0 , produced only when is t ur ned ON , is a b inary file containin g the acti ve measurement tra ce and di splay graticule.
4-50 Printing, Pl otting, and S aving Measurement Resul ts Savin g Measurement Resul t s Raw Arrays On the analyzer , press the Data cr eated the fir st time in this manner wi l l be sa ved as fil ena me “FILE00.
4- 51 Printing, Pl otting, and S aving Measurement Resul ts Re-Sa ving an Instr umen t State Re-Savin g an I n strument State If y ou re-save a file , the analyzer overwrites t he existing fi le contents . NO TE Y ou cannot re- save a fi le that c ontains data on ly .
4-52 Printing, Pl otting, and S aving Measurement Resul ts Delet ing a File Deleting a F ile 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .
4- 53 Printing, Pl otting, and S aving Measurement Resul ts Renami ng a File Renaming a File 1. Pre ss . 2. Choose from the f ollowing stor age devices : ❏ ❏ ❏ (I f necessary , refer to the ext er nal disk s etup procedure i n "Sav ing an Instrument State" on p age 4-38 .
4-54 Printing, Pl otting, and S aving Measurement Resul ts Recalling a File Recalling a File 1. P ress . 2. Choose fr om the foll ow ing storage devices: ❏ ❏ ❏ (If nec essary , refer to the ex ternal disk set up procedure in "Sa ving an Instrument St a te" on page 4- 38 .
4- 55 Printing, Pl otting, and S aving Measurement Resul ts Solving Pr oblems with Saving or Recalling Files Solving P roblems wit h Savin g o r Recalling Files If y ou encounter a p r oblem when you .
4-56 Printing, Pl otting, and S aving Measurement Resul ts Solvi ng Prob lems with Savi ng or Recal ling Fil es.
5-1 5 Optimi zing Me asurem ent Results.
5-2 Optimizing Measur em ent Results Using This C hapter Using This C hapter This cha pter descri bes tec hni ques and analy zer functions tha t help y ou a chiev e the best measurement r esults .
5- 3 Optimizing Measurement R esults T aking C ar e of Microwa ve Connectors T aking Ca re of M icrow ave Connecto rs Proper co nnec tor car e a nd connecti on techniques are critic al for accur ate, r epeatable measurements . Refer to the calibrati on kit documentati on for connecto r care informati on.
5-4 Optimizing Measur em ent Results Increasing Measurement Accuracy In creasing Measurement Accur acy The fol lowing all contribute t o loss of a ccuracy i n a measurement.
5- 5 Optimizing Measurement R esults Increasing Measur em ent Accuracy T emperature Drift Electrica l character istics will change wi th temperature due to the thermal expansion characte ristics of d evices withi n the analyzer , cali bration device s, tes t devices , cab les, and adapters .
5-6 Optimizing Measur em ent Results Increasing Measurement Accuracy Y ou can acti v a te a p or t extens ion by pressing . Then enter the delay to t he reference p lane.
5- 7 Optimizing Measurement R esults Main t aining T est P o rt Out put P ower During Sweep Retrace M ain taining T e st P ort Output P o wer D uring S we e p Retra ce During sta nd ard operati on, the anal y zer provi d es output power d uring its forward frequency sw eep , but may not p r ovi de outp ut power during its s w eep re trac e .
5-8 Optimizing Measur em ent Results Making Accu rate Measureme nt s of El ectrically Long Devices Maki ng Accura te Measuremen ts of Elect rically Long Devices A d evice wit h a long electr ical del .
5- 9 Optimizing Measurement R esults Making Accurate Measurem ents of Elect ri call y Long De vices De creas i ng the Sweep Rat e The sweep r a te can be dec reased by inc reasing the a nalyzer’s s w eep time .
5-10 Optimizing Measur em ent Results Increasing Sweep Speed Incre asing Sweep S peed Y ou can incre a se the anal yzer sweep speed b y avoi d ing the use o f some fea tures that requir e computational ti me for impl ementation and upda ti ng, s uch as bandwidth marker tracki ng.
5- 11 Optimizing Measurement R esults Increasing S w eep Speed Sw eep S pee d-R elat ed Err or s IF delay occurs dur ing swept measurement s when the si gnal from t he analyzer sourc e is delay ed in reac hing the anal yzer receiver because of an electricall y long devi ce.
5-12 Optimizing Measur em ent Results Increasing Sweep Speed T o Set the Auto Sweep T ime Mode Auto s w eep time mode i s the defa ul t mode (the preset mode). T his mode m aintains the fast es t sweep speed possible f or the c ur rent measurem ent settings .
5- 13 Optimizing Measurement R esults Increasing S w eep Speed T o View a Sing le Measur ement Channel View ing a single channel wil l increase th e measurement speed if the analyze r’s cha nnels are in a lternate, or uncoupled m ode. 1. Pre ss . 2.
5-14 Optimizing Measur em ent Results Increasing Sweep Speed • Cont inuou s: In this mode the analyz er will switc h between the test ports on every sweep . Although thi s type o f test set switching provides the g reatest me a surement accu r acy , it re qu i re s a re v erse sw eep fo r e ve ry fo rwar d sw eep.
5- 15 Optimizing Measurement R esults Increasing Dynamic Range Increa sing Dynamic Rang e Dynamic range i s the di f ference b etw een the ana lyzer’s maximum all owable in p ut level and minimum measurabl e power . F or a measurement to be valid, input signals m ust be within thes e boundaries .
5-16 Optimizing Measur em ent Results Reducin g N oise Reduci ng Noise Y ou can use two a nalyzer f unctions to hel p reduce the effect of noise on the data trace: • activate m ea surement a v eragi.
5- 17 Optimizing Measurement R esults Reducin g N oise T o Use Direct Sampler Access Configurations (Option 012 Only) Direct s ampler access to both the A and B samplers c an decre a se the noi s e floor of the analyzer .
5-18 Optimizing Measur em ent Results Reducin g Receiver Crosst alk Reduci ng Rece iver Cro sstal k T o reduce r eceiver c r osstalk you c a n do the f ollowing: • P erform a resp onse and isolat ion measurement c a libration. • Set the s w eep to the alternate mode .
6-1 6 Cali brat ing f or I ncr eased Measu remen t Accu racy.
6-2 Cali brat ing for Increased Measur ement Accuracy How to Use Th is Chapter How to Use This Cha pte r This cha pter i s divided int o the foll owing subjects: • "Calibrat ion Considerati ons.
6- 3 Calibrating f or Increased M easurement Accuracy Intr oduction Introd uction The accuracy of network anal ysis is g r eatly inf luenced by fact ors external t o the network analyzer .
6-4 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Ca libr ati on Co nsi de r atio ns Measurement P arameters Calibra tion procedur es are paramete r- specific, rather than c hannel-speci f ic.
6- 5 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations • 90 to 100 dB: I solation c alibration i s recommended with test port power g reater t ha n 0 dBm. F or this isol ation cali b ration, averaging shoul d be turned on w ith an a veraging facto r at least f our times the measurement av er aging fac tor .
6-6 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Frequency Response of Calibration Standards In or d er for th e response of a refer ence standard to show as a dot o n the smith chart displ ay format, i t must hav e no phase shift w i th res p ect to fr equency .
6- 7 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations T able 6-1 Calibration Stan d ard Types and Expected Phase Shift T est Port Conn ector T ype Standa rd T ype Expected Phase Shift 7-mm Short 180 ° Type-N ma le 3.5-mm mal e Offset S hort 3.
6-8 Cali brat ing for Increased Measur ement Accuracy Cali bration C onsiderations Fi gu re 6-1 Typical Re spon se s of Calibration S tandards after Calibration Interpolated Error Correction Y ou may .
6- 9 Calibrating f or Increased M easurement Accuracy Calibrati on Consi derations NO TE T he preset sta te of the i nstrument can b e configured so that int er polated error cor rection is on or off . Press to c onf ig ur e the pres et state of i nterpolated er ror correc tion.
6-10 Cali brat ing for Increased Measur ement Accuracy Pr ocedur es f or E rr or Correcting Y our M easurements Proc edur es for Error Correct ing Y our Measur ements This sec tion has exampl e proced.
6- 11 Calibrating f or Increased M easurement Accuracy Pro cedures fo r Err or Correctin g Y our Measurements NO TE Resp onse calib ration is not as accurate as other cali bration methods . En han ce d R e spo nse and En hanced Reflection Transmis s i on or reflect ion measurement w hen improved accurac y is desired.
6-12 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Fr e q uency R espon se Error Correc t ions Y ou can remove the frequency re s ponse of the test setup fo.
6- 13 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections Fi gure 6-2 S ta n dard Connect ions for a Response Error Correct ion for Reflecti on Measurement 7. T o measure t he standard when t he display ed trace has s ettled, pres s or .
6-14 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Response Error Correction for Transmission Measurements 1.
6- 15 Calibrating f or Increased M easurement Accuracy Frequency Response Erro r C orr ections NO TE Do n ot use an open or short stand a rd for a transmission r esponse correc tion. NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements .
6-16 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response Er ror Correction s Figure 6-4 St anda rd Conne ctions f or a Rec eiver C alibratio n 3. T o choose a non-ratioe d measurement, pr ess : F or ES analyzers , press . This s ets the sour ce at PORT 1.
6- 17 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections Frequen cy Response an d Isolat ion Er ror Corr ections Y ou c an make a response and isola.
6-18 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 7. Make a "thru" connection b etween the point s where you wil l connect your device und er test. NO TE Include any adapters that y ou will ha ve in the d evice measurement.
6- 19 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections 12.Return the a v eraging to the ori gina l state of the measurement. F or example , reduc e t he av er aging fac tor by at l ea st four times or turn a veraging of f .
6-20 Cali brat ing for Increased Measur ement Accuracy Frequen cy Response and Isolation E rror C orrections 5. If your calibra tion kit is dif ferent tha n the kit s peci f ied under the sof t key , .
6- 21 Calibrating f or Increased M easurement Accuracy Frequenc y Response and Isolation Er ror Corr ections The anal y zer displ ays WAIT - MEA SU RIN G C AL ST AND ARD during the sta ndard measurement. T he anal y zer underli nes the softkey tha t you sel ec ted after it fi ni shes the meas ur ement, and c om putes the er ror coeffi cients .
6-22 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on Enha nced F requen cy Respons e Error Co rrecti on The enhanc ed frequenc y response error c orrec.
6- 23 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on 6. T o selec t the correc tion type, pr ess and s el ect the c orrection ty pe.
6-24 Cali brat ing for Increased Measur ement Accuracy Enhanced Frequency Response Err or Correcti on 12.T o measure the sta ndard, when the d isplaye d trace ha s settl ed , press: , se lect the ty p e of lo ad y ou are us ing , and then pr ess when the analyze r has finished m easuring the load.
6- 25 Calibrating f or Increased M easurement Accuracy Enhanced Frequency Response Erro r Correcti on b. Activate at l east four times more av er ages than d esired duri ng the devic e measurement. c. Pr ess . d. Return t he averaging to the orig inal state of the measurement , and press .
6-26 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection On e -P o rt Re fl ection Error Co rrec t ion • removes dir ec tivity errors of t he test se tup • rem.
6- 27 Calibrating f or Increased M easurement Accuracy One-Po rt Reflection Erro r C orrection NO TE Include any a d apters that you will ha ve in the dev ice measurement . That is , connect the c alibration standard to the p articular connector where y ou will connect your d evice under test.
6-28 Cali brat ing for Increased Measur ement Accuracy One-P ort Reflection Error C orrection The analyzer d isplay s the corre cted data tr a ce. T he analyzer al s o shows the notation Cor to the left of t he screen, i ndicating that the cor rection is s w itched on for this channel.
6- 29 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) Ful l Two- P ort Erro r C orrect ion (E S A nalyze r s On ly) • removes directi vity.
6-30 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) Figur e 6-9 St anda rd Conne ctio ns for Full Tw o -P ort E rror C o rrection 6.
6- 31 Calibrating f or Increased M easurement Accuracy Full T w o- P or t Erro r Correction (ES Anal yzers Onl y) 14.Make a "thru" connectio n between the poi nts where you wil l connect y our device und er test a s shown i n Fi gu re 6- 9 .
6-32 Cali brat ing for Increased Measur ement Accuracy Full T wo-P ort Error Correcti on (ES Analyzers Only) 17.T o compute the er r or coeff icients , press : The analyzer d isplay s the corre cted measurement tr a ce. The analyzer a lso shows t he notation Cor at the left of the screen, i ndicating that error c orrectio n is on.
6- 33 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on P ow er M eter M e asu reme nt Calib ratio n A GPIB-compatib le power mete r can monitor a nd correct RF source power to a chieve leveled pow er at the te st port.
6-34 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Interpolation in P ower Meter Calibration If the frequency is changed in li nea r sweep, or the sta rt/stop pow er is cha nged in power sweep , then t he calibration d ata is inter polated for the new range .
6- 35 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on ❏ If y ou are modifying the frequency , enter the new value, followed by a , , or key . ❏ If y ou are modifying the correction f actor , enter the new value , follo w ed by the key .
6-36 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration NO TE Remember to subtrac t the through a rm loss f r om the coupl er arm loss b efore enteri ng it i nto the power l oss table, to ens ure the correct power at the output of t he coupler .
6- 37 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on 3. Select t he a nalyzer a s the sy s tem control ler: 4. Set the p ow er meter’ s address (“XX” represents the address in the following keystrokes: 5.
6-38 Cali brat ing for Increased Measur ement Accuracy P ower Me t er Measurement C alibration Using Continuous Correction Mode Y ou can set the analyzer to up date the cor rection table at each sweep (as in a l eveling applica tion), using the continuous s ample mode .
6- 39 Calibrating f or Increased M easurement Accuracy Po wer Meter Measurement Calibrati on T o Calibrate the Analyzer Receiver to Measu re A bsol u te P ower Y ou can use the power meter calibrati on as a referenc e to calibrate the analy zer receiver to accuratel y measure absol ute power .
6-40 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Ca libr ating for No ni ns ert able D evic es A tes t device that c annot be c onnected directly into a tr ansmission test c onfiguration i s consider ed to be noninser t able .
6- 41 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices Adapter Rem oval Cal ibration (ES Analyz ers Only) Adapter r em oval calibr ation provid es the most c omplete and acc ur ate proc ed ure for measuring noninsertable dev ices.
6-42 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices P erform the 2-P ort Error Corrections 1. Check the firmware to see if y our revision s upports adapter r em oval ca libration by pre ssing: 2. Determine the delay of a dapter A3.
6- 43 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices NO TE Y ou must use t he floppy d isk to store t he following c a librations . Select the floppy dis k by pressi ng . 3. Connect adapter A3 (same sex and c onnector ty p e as the DUT) to adapter A2 on port 2 as s how n in Figu re 6-15 .
6-44 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices 6. P erform a ful l 2-port c a libration b etween ports 1 and 2 using c alibration s tandards appropriate for the c onnector type a t port 2 (the co nnec tor type f or adapter A2 ) .
6- 45 Calibrating f or Increased M easurement Accuracy Calibrating f or N oni nsert ab le De vices V erify the Results Since the effect of the adapter has been removed, i t is easy to v erify the accuracy of the techni q ue by simply measuring the ada p ter itsel f.
6-46 Cali brat ing for Increased Measur ement Accuracy Cali br ating f or Noninsertabl e Devices Modify the Cal Kit Thru Definition Wi th this method, it is onl y necessary to use a th r u adapter . The calibr ation kit thru defini tion is modified t o compensa te for the adapter and then sav ed as a user kit.
6- 47 Calibrating f or Increased M easurement Accuracy Minimi z ing Er r or W hen Using Adapte r s 9. Pe rform the des ired calibr a tion with this new user ki t.
6-48 Cali brat ing for Increased Measur ement Accuracy Making No n- Coaxial Measur em ents Making Non- C oaxial Me asu rements Non-coax i al, on- wafer measurement s present a unique set of challeng e.
6- 49 Calibrating f or Increased M easurement Accuracy Making Non - Coaxial Measure m ents If Y ou W ant to Design Y our Own Fixture Ideall y , a fixture shoul d provide a transparent c onnection between the tes t instru ment and the test device.
6-50 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) Calibr ating for No n-Coaxi al Devic es (ES A na lyzers Only) The anal y zer has the capabilit y of making cali b rations u s ing the TRL*/LRM* met hod.
6- 51 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) 6. F or the purposes of th is example , change the na me of the sta ndard by pressi ng: and modi f ying the name to "LINE.
6-52 Cali brat ing for Increased Measur ement Accuracy Calibrati ng f or Non-Coaxial D evices (ES Analyzers O nly) P erform the TRL Calibration 1. P ress . 2. T o measure the "TRL THRU ," connec t the "zero l ength" tran s mission line b etween the two test p orts .
6- 53 Calibrating f or Increased M easurement Accuracy Calibrating f or Non-Coaxial De vices (ES Analyzers Onl y) NO TE Y ou can sa v e or st or e the measur em ent correc tion to use for later measurements . Refer t o Chapter 4 , “Printin g, Plotting, a nd Savi ng Measurement Results” f or procedures .
6-54 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on LRM Erro r C orre ction Create a User -Defined L RM Calibration K it In or d er to use the L RM technique , the c a libration s tandards c ha racteri s tics must b e entered i nto the anal yzer’s user d efined c a libration ki t.
6- 55 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion Assign the Standards to the V arious LRM C lasse s 8. T o assig n the calibrati on standards t o the various T RL calibr a tion cl asses, press: 9. Since you p r eviously d esignated sta nd ard #1 f or the REFLECT standard, press: 10.
6-56 Cali brat ing for Increased Measur ement Accuracy LRM Erro r Co rr e cti on P erform the LRM Calibration 1. Y ou must ha ve a LRM cali bration kit d efined and sa ved in the USER KIT , as shown i n "Modifying Calibration Kits" on pa ge 7-57 .
6- 57 Calibrating f or Increased M easurement Accuracy LR M E rror Co rrect ion NO TE Y ou should per form the is ol ation measur em ent when the hi ghest dynamic rang e is desire d. T o perform the b est isolati on measurements , you s hould reduce the system bandwidth or a ctivate t he averagi ng function.
6-58 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) Calibr ating Usin g Electron ic Calibr ation (EC al) This sec tion descri bes Electronic Calibrati on (ECal). Use the f ollowing steps to per form the cali b ration.
6- 59 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Connect the ECal Equipment 1. Connect the powe r supply to the PC interfa ce unit. Ref er to Fi gur e 6 -21 . Fi gure 6-21 ECal Setup 2. Connect the powe r supply to the ac s our ce.
6-60 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. If y ou need to cal ibrate with a second ECal module , connect one end of another DB25 cable t o the connecto r on the P C interface uni t label ed "DB25 Interf ace to ECal Module B".
6- 61 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) • ECal using isol ation aver aging During the isolati on m easurement p ortion of ECa l, you are a ctually measuring instr ument crosstalk.
6-62 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) P erform the Calibration 1. P ress . When ECal i s fi rst sele cte d (or when you select m.
6- 63 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Figure 6 -22 M anual T hru S etup 5. After you c onnect the manual thr u, press to complet e the manual thru por tion of the ECal.
6-64 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 7. After you connect the sec ond ECal module , press to continue the ECal. 8. Repeat st ep s 4 and 5 if you sel ec ted to ca librate usi ng the manual thru op tion.
6- 65 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) P erform the Confiden ce Check The confi d ence check i s a means of vi sually checking the quality of the ca l ibration.
6-66 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) 5. Press unt il the cal ibration conf idence check tr ace that you w a nt to view is di spla yed . Pressing the softkey toggles between the five tr a ce-type displa y options.
6- 67 Calibrating f or Increased M easurement Accuracy Calibrat ing Using Elect r o nic C al ibr at ion (ECal) Investigating th e Calibra tion Results Using the ECal Service M enu CAUTI ON The confidence c heck described in t he p revi ous section disp lays the ECal data of a sing le state.
6-68 Cali brat ing for Increased Measur ement Accuracy Cali brating U sing El ectroni c Calib r atio n (ECal) NO TE W hen returning to the Conf idence Check m enu from the ECal Se r vice menu, pres s the softkey on the ECal Confidence Check menu.
6- 69 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Ada pter Remov al Using EC al ( ES Analyz ers Only) A device under test (DUT) w hose connector s cannot be co nnected direct ly to a t es t configura tion is consi d ered to b e a noninsertable de vice .
6-70 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Figur e 6-2 6 Adap ters N eed ed The fol lowing requir ements must also b e met: • An ECal module f or performing a 2-por t error corr ec tion for e ach connector type must be avai la ble.
6- 71 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) P erform the 2-P ort Error Corrections 1. Connect ada pter A3 to a da pter A2 on port 2 as shown in Figur e 6-27 . Fi gure 6-27 Two-P ort Cal Set 1 2.
6-72 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Fi gu re 6-28 Two-P ort Cal Set 2 7. Connect the ECal module betwee n a dapter A3 and adapter A2. 8. P ress . 9. Press to p erform t he second 2-port error corr ec tion using the ECal mod ule.
6- 73 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) Determine the Electric al Delay This proced ure determines the el ectrical delay of a dapter A3 usi ng a short. 1. Refer to Figu re 6-29 while perf or ming the s teps in t his procedure .
6-74 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only) Remove the Adapter When the t wo sets of er ror cor r ection f iles have b een creat ed (now referred to as "cali bration sets "), the A3 ada pter ma y be removed.
6- 75 Calibrating f or Increased M easurement Accuracy Adapter Removal Using ECal ( ES Analyzers O nly) 10.Connect t he DUT to the netw ork analyzer as s hown in Figure 6- 30 to perfor m cali brat ed measurements .
6-76 Cali brat ing for Increased Measur ement Accuracy Adapter Remov al Using ECal (ES Analyzers Only).
7- 1 7 Oper ati ng Co ncepts.
7- 2 Operating Concept s Using This C hapter Using This C hapter This cha pter provides conceptual i nformation o n how speci f ic funct ions of the netw ork analyzer o p erate .
7- 3 Operati ng Concepts System Operation System Operati on Network analyzer s measure the r eflec ti on and t r ansmission cha racteristi c s of devices and networks .
7- 4 Operating Concept s System Operation The RF outp ut power i s leveled by an int ernal ALC (autom a tic l ev eling contr ol) c ircuit. T o achie ve frequency acc uracy and phase mea suring capa b ility , the analy zer is phase locked to a highly sta b le crystal os cillator .
7- 5 Operati ng Concepts Processing Proc e ssing The analyzer ’s receiver converts the R, A, and B input signals i nto useful me asurement informati on. This conv er sion occ ur s in two m a in steps: • The swept high frequency i nput signals are tra nslated to fixe d l ow frequency IF signals , using analog sampling or mixing tec hni ques .
7- 6 Operating Concept s Pr ocessi n g While onl y a s ingle flow p ath is s hown, two identical p aths are a vailable , corr esponding to channel 1 and c hannel 2. Eac h channel al so has an auxilia r y channel f or which the d ata is proce s sed along w i th the pr imary channel’ s data.
7- 7 Operati ng Concepts Processing Pre-Raw Data Arrays Th e se dat a a rray s store the re su l ts of all the pr ec eding data processing oper ations . (Up to this point, a ll process ing is perf ormed real-ti m e with the swe ep by the IF process or .
7- 8 Operating Concept s Pr ocessi n g Tran sform (Option 010 Only) This t ransform converts frequency do m a in inf or mation into the time do m a in when i t is activ a ted. The r esults r esemble time domain reflectometry (TDR) or impul se-response measurements .
7- 9 Operati ng Concepts Out put Power Output P owe r Understanding the P ow er Ranges The built - in synthes ized source c ontains a progr am mable step at tenuator that a llows you to directl y and accur a tely set p ow er lev el s in twel ve different power ranges .
7- 10 Operating Concept s Out put Power NO TE After measureme nt c a libra tion, you can c ha nge the pow er w ithi n a r a nge and still maintain near ly full a c curacy . In some cases b etter accuracy can be achiev ed by changi ng the power wit hin a range .
7- 11 Operati ng Concepts Sweep Time Swe ep Ti me The softkey se l ects sweep time as the act ive entry and s hows whether the automati c or manual mode is active . The fol lowing explains the diffe r ence between automatic a nd manual sweep t ime: • Ma nual swee p time.
7- 12 Operating Concept s Sweep Time In additio n to the these parameters , the actual cycle time of the analyzer is also dependent on the f ollowing meas urement parameters: • smoothing • l im it.
7- 13 Operati ng Concepts Sour ce Atten uator Sw i tc h Pr ot ection Sourc e At tenuator Switch Pr otection The programmable step attenuator o f the source can be s witched bet ween port 1 and port 2 when the test port power i s uncoupled, or between cha nnel 1 and cha nnel 2 when the channel pow er is uncouple d.
7- 14 Operating Concept s Channel Stim ulus Cou pling Cha nnel Sti mulus Coupl ing toggles the channe l coupling of stimulus v alues. With ( the preset c ondition), both c hannels have the sa m e stimulus val ues. (The ina ctive cha nnel takes on the stimulus v a lues of the active channel.
7- 15 Operati ng Concepts Sweep T ypes Swe ep Types The foll ow ing sweep types will f unc tion wit h the interpol ated error -cor rection fea tur e (describ ed in “ Interpolated Er ror Correcti on.
7- 16 Operating Concept s Sweep T ypes NO TE Earlier 8719, 8 720, and 8722 mo d els all ow ed a maximum of 1 632 points , but this v alue was reduced to 1601 to a dd the 4 channels in the 4 -parameter dis play feat u re. One l ist is common to both channels .
7- 17 Operati ng Concepts Sweep T ypes The frequenc y subsweeps , or seg m ents, can be define d in any of the follo w ing terms: • start/stop/number of points • start /stop/step • center/span/ number of points • center/s pan/step • CW frequency The subsweeps c a n overl a p, a nd do not ha ve to be entered in any pa r ticular or d er .
7- 18 Operating Concept s Sweep T ypes The fr equency subsweeps , or segm ents , can be d efined i n a ny of t he following terms: • start/sto p/number of points /power/IFBW • start/sto p/step/pow.
7- 19 Operati ng Concepts Sweep T ypes Sett ing Segm ent IF Band widt h T o enable th e func tion, you must f irst selec t in the edit s ubsweep menu. List IF b a ndwidth is of f by d efault and the a.
7- 20 Operating Concept s S-P ara meter s S-P a ra me t ers The key acc ess es the S- parameter menu whic h contains s oftkeys tha t can be used to s elect the para meters or inp uts that define the type of m easurement b eing perfor med.
7- 21 Operati ng Concepts S-Para me ters Fi gu re 7-3 S-P arameters of a Two-P ort D evic e S-parameter s are exactl y equivalent to these more common desc ription ter m s , requiri ng only that t he measurements be ta ken with all test devic e ports properl y terminated.
7- 22 Operating Concept s S-P ara meter s The S-P arameter Menu The S-p a rameter menu al lows you to d efine the input ports a nd test set direction f or S-para m eter measurement s. Th e a nalyzer a utom atically s witches the direction of the measurement a ccording t o the selec tions you made i n this menu.
7- 23 Operati ng Concepts S-Para me ters Fi gu re 7-4 Reflection Impedance and Admittance Conversions In a tra ns mission meas ur ement, the d ata can be c onv erted t o its equiv a lent serie s impedance or a dmittance us ing the model a nd equatio ns shown in Figure 7-5 .
7- 24 Operating Concept s Anal yz er Displa y Formats Analyzer Dis play F o rmats The key a c cesses the f ormat menu. This m enu allows you to select the appropri ate displa y format for the measured dat a . The anal y zer automati c ally c ha nges the units of measu r ement to co r respond with the displ ayed format.
7- 25 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-7 Phase F ormat Group Delay F ormat The sof tkey selec ts the g roup delay format, with marker v alues giv en in seconds. The bandpass filte r r esponse f ormatted as group del ay is shown in Fig ure 7-8 .
7- 26 Operating Concept s Anal yz er Displa y Formats Smith Chart F ormat The softke y displa y s a Smith ch art format. Ref er to Figur e 7-9 . Thi s is used i n reflecti on m easurements t o provide a rea dout of the data in terms o f impedance .
7- 27 Operati ng Concepts Analyzer D i splay Formats P olar F orma t Th e soft k e y disp lay s a pola r form at as show n in Fig ure 7- 10 . Eac h point on the polar fo rm at corres p onds to a p articular v alue of both m agnitude and phase .
7- 28 Operating Concept s Anal yz er Displa y Formats Figure 7-11 Li nea r Mag nitude Format SWR F ormat The sof tkey reformats a reflec tion measurement i nto its equi valent SWR (stan d ing wav e ratio) v alue. S ee Fig u re 7- 12 . SWR is equivalent to (1 + ρ )/(1 − ρ ), whe r e ρ is the reflec tion coeff icient.
7- 29 Operati ng Concepts Analyzer D i splay Formats Real F ormat The soft k ey displa ys only the r eal (resisti ve) porti on of the meas ur ed data on a Cartesi a n format. See Fig ure 7 -1 3 . This is simi lar to the linea r magnitude format, bu t can show both positive and negati ve values .
7- 30 Operating Concept s Anal yz er Displa y Formats Fi gure 7-14 Constant Group Delay Note, how ever , tha t the p hase cha r acteristi c typicall y consists of both linea r and higher order (deviations from linear) comp onents .
7- 31 Operati ng Concepts Analyzer D i splay Formats Fi gu re 7-16 Rate of Phase Change V ersus Fre q ue nc y When deviatio ns from li near phase are p resent, changing the frequency step ca n result i n different values fo r group dela y . Note that i n this case the computed sl ope varies a s the aperture ∆ f is incr eased .
7- 32 Operating Concept s Anal yz er Displa y Formats The def a ult gro up delay a perture i s the fr eq uency span di vided by the num b er of poi nts across the display . T o set the ape r ture to a different v alue, tur n on smoothing in the av er age menu, and v ary the smoothing aperture .
7- 33 Operati ng Concepts Electrical Delay Electrical Delay The softkey adjusts the electri cal dela y to balance the phase of the test dev ice. T hi s softkey m ust be us ed in conj unc tion wit h or (with c ut-off f r equency) i n order to i d entify whi ch type of transmission l ine the d elay is b eing added t o.
7- 34 Operating Concept s Noise Reduction T ec hniques Nois e Reductio n T echniq ues The key is used to a c cess thr ee d iff er ent noi se reduction tec hni ques: sweep-t o- sweep av er aging , displ ay smoothing , and var i able IF ba nd width. All of these can b e used simul ta neously .
7- 35 Operati ng Concepts Noise R ed uction T echniques Smoothing Smoothing ( similar to video filter ing) avera ges the formatt ed acti v e channel d a ta over a portion of the dis played tra ce.
7- 36 Operating Concept s Noise Reduction T ec hniques Another d ifference b etween sweep-to- sweep averag ing and variable IF bandwidth i s the sweep ti me. A veraging di s plays the first c omplete tra c e faster b ut takes severa l sweeps to reac h a fully av eraged trac e.
7- 37 Operati ng Concepts Measurement Calibr ation Measurement Calibr atio n Measurement calibrati on is an a ccura cy enhancement procedure that effecti ve ly removes the syst em errors tha t cause uncer tainty i n m easuring a t est device.
7- 38 Operating Concept s Measurement Calibr ation What Causes Measurement Errors? Network analysi s measurement errors ca n be separated into sy stematic , random, and drif t error s. Correct able systemati c er ror s are the repeatable errors that the system c an measure .
7- 39 Operati ng Concepts Measurement Calibr ation However , an actual coupler is no t per fec t, a s shown in Figure 7- 21 b. A smal l a mount of the incident signal appear s at the coupled output d ue to lea k age as wel l as reflec tion from t he termination in the coupled arm.
7- 40 Operating Concept s Measurement Calibr ation Load Match Load match error res ults from an imp erfect matc h at the outp ut of the t est device . It is caused b y impedance m ismatches bet ween the test d evice o utput port and p ort 2 of the measurement system.
7- 41 Operati ng Concepts Measurement Calibr ation Frequency Response (T rac king) This is the vector sum of all test setup variatio ns in which magnitude and phase change as a functi on of freque nc y .
7- 42 Operating Concept s Measurement Calibr ation T o c ha racterize the er rors , the reflec tion coef f icient is measured by f irst separ a ting the inc ident si gnal (I) f rom the reflec ted s ig nal ( R) , the n taking the ratio of the tw o values .
7- 43 Operati ng Concepts Measurement Calibr ation This re-ref lection ef fect and the resulta nt incident powe r variation a re caused b y the source match error , E SF as show n in Figure 7- 27 .
7- 44 Operating Concept s Measurement Calibr ation If the value of t hese three "E" errors and the measured test device resp onse were known for ea ch frequency , this e q uation could b e solved for S 11A to obtain the a ctual test d evice resp ons e.
7- 45 Operati ng Concepts Measurement Calibr ation Fi gu re 7-30 Measu r e d Effec t ive Directivity Next, a short ci rcuit te r mination whos e response i s known to a very hi gh degree i s used t o establish a nother conditi on as shown in F ig u re 7- 31 .
7- 46 Operating Concept s Measurement Calibr ation Fi gure 7-32 Open C ir cuit T e rmination This compl etes the c alibration pr oc edure for one port d evices . Device Measurement Now the unknown i s measured t o obtain a v a lue for the measured resp onse, S 11M , at ea ch frequency .
7- 47 Operati ng Concepts Measurement Calibr ation Two-P ort Error Model (ES Models Only) The error mo d el for m easurement of the transmissi on coeffic i ents (magnit ude and phase) of a two-p ort device i s derived i n a similar m a nner .
7- 48 Operating Concept s Measurement Calibr ation As in t he reflection mo del, source match can cause the incident s ig nal to vary as a f unction of t es t device S 11 A .
7- 49 Operati ng Concepts Measurement Calibr ation NO TE It is very i mportant tha t the exact ele ctrical len gth of the thr u be known. Most calib r ation ki ts assume a zero l ength thru. F or some connecti on types such a s Type-N , this impl ies one mal e and one f emale port.
7- 50 Operating Concept s Measurement Calibr ation The anal yzer’s tes t set can meas ure both the fo rward and rev erse ch aract eris tics of the test devic e without you ha ving to manua l ly remove and physically r everse the dev ice. A f ull two-po r t error mo d el illus trated in Figu re 7-3 8 .
7- 51 Operati ng Concepts Measurement Calibr ation Fi gu re 7-39 Full Two-P ort Error Model Equations How Effective Is Accuracy Enhancement? In additi on to the er rors removed by accuracy enhanc em ent, other s y stematic er rors exist due to li mitations of d ynamic accur a cy , tes t set switch repeatability , and te s t cable stabili ty .
7- 52 Operating Concept s Measurement Calibr ation Figu re 7-4 0 a shows a measurement i n log magnit ud e format w ith a response c alibration only . Fi gur e 7 -40 b shows th e improvement in the same measurement using an S11 one-por t c a li bra tion.
7- 53 Operati ng Concepts Measurement Calibr ation The response of a devic e in a lo g m agnitude for mat is shown in Fig ure 7-4 2 . Figu re 7-4 2 a shows the response using a response calibrati on and Fi gure 7-42 b the response usi ng a ful l two-port c a libration.
7- 54 Operating Concept s Cali bration R outines Ca libr ati o n Ro ut in es There are tw elve diffe r ent error te rms for a tw o-port measurement tha t can be c or rected by accur acy enhanc ement in the anal yzer .
7- 55 Operati ng Concepts Calib r atio n Routines Enh anc ed Ref lec tion Calibr ation The enhanced r eflection c a librat ion is activ a ted by s electing under the menu. The enhanced r eflection c a librat ion effecti v ely removes l oad match er r or from the enhanced res ponse calibr a tion perf or med on a bil ateral device .
7- 56 Operating Concept s Cali bration R outines E-CAL The E-Cal calibrat i on menu is acti vated by pr essing in the c alibratio n menu. The E-Cal (Elec tronic Ca libration) system determi nes systemic err ors of the analyzer throug h a one-time connec tion of a n E-Cal module to the network a na lyzer ports .
7- 57 Operati ng Concepts Modi fyi ng Calibrati on Ki ts M odi fying C alib ration K its Modifying ca libration ki ts is nec essary only i f unusual standa r ds (suc h as in TRL*) a re used or the very highest accuracy is required.
7- 58 Operating Concept s Modi fying Cali bration Kits Procedure The fol lowing steps a re used t o modify or def ine a use r kit: 1. Select the predefined ki t to be m odified. ( T his is not necessary f or defi ning a new calibration ki t.) 2. Define the standards: • Def ine which "type" of standard it is.
7- 59 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • l eads to a menu for construct i ng a labe l for the user- modified cal kit. If a label is supplied , it will appear as one of the fi v e softkey c hoices in t he select c al kit menu.
7- 60 Operating Concept s Modi fying Cali bration Kits After a standard number i s entered, s electi on of the standa r d type wil l present o ne of five menus f or entering the electri cal character istics ( model coeffi cients) cor r esponding to that stand a rd type, s uch as .
7- 61 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • def ines the s ta ndard type as a transmission l ine of speci fi ed leng th, f or cali brating transmis sion measurements . • de f ines the standard type to be a loa d , but with a n arbi tr ary impedance ( different f rom system Z0) .
7- 62 Operating Concept s Modi fying Cali bration Kits The fol lowing is a descriptio n of the s oftkeys l ocated within the specif y offset m enu: • all o ws you to spe c ify the o n e -way e le c trica l del ay fro m th e measurement (r eference) pl a ne to the standard, in sec onds (s).
7- 63 Operati ng Concepts Modi fyi ng Calibrati on Ki ts A class often c onsists of a si ngle standard, b ut may be composed of more than one sta ndard if band-l imited stand ards are us ed.
7- 64 Operating Concept s Modi fying Cali bration Kits NO TE It is of ten simpler to keep the number o f standards p er clas s to th e b are minimum need ed (often one) to a v oid confu s ion during c alibration. Each c lass can be given a user -definab le label as d escribed under label cl ass menus .
7- 65 Operati ng Concepts Modi fyi ng Calibrati on Ki ts • allows y ou to enter the sta ndard numbers f or a TRL line o r mat ch c alibr ati on. Label Class Menu The label c lass menus a re used t o define meaning f ul label s for t he calibration c lasses .
7- 66 Operating Concept s Modi fying Cali bration Kits Modifying and Saving a Calibration Kit from the Calibration Kit Selection Menu T o modify a c alibration kit from the cali b ration kit selection menu, pr ess : T o sav e the modified calibration ki t, press: or Ensure that is underlined b ef ore sav ing the modifi ed user kit.
7- 67 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) TRL*/LRM* Calibration ( ES Models On ly) The network anal y zer has the capabilit y of making cali b rations us ing the " TRL " (thru-ref lec t- l ine) method.
7- 68 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) TRL T erminology Notice that the let ters TRL, LRL, L RM, etc. are often interchanged, depending on the stand a rds used.
7- 69 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Also notic e that the f o rwar d source m atch (E SF ) and rev erse lo a d ma tch (E LR ) are both represented by ε 11 , while the reverse source match ( E SR ) an d forward lo ad match (E LF ) ar e both repres ented by ε 22 .
7- 70 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Fi gure 7-44 8-term TRL (or TRL*) Error Model an d General ized Coe fficients S our ce ma tch a nd l oad matc h A TRL cal ibrati on .
7- 71 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) Improving Ra w Sourc e Match and Load Match for TRL*/LR M* Calibration A techn ique that c an be u s ed to i m prove the raw test port mismatc h is to add high q uality fixed attenuato rs .
7- 72 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) Transmi s sion mag nitude uncertaint y = E X + E T S 21 + E S S 11 S 21 + E L S 22 S 21 where: E D = ef fe ctiv e dir ec t iv ity E .
7- 73 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) • Attenuati on of the thr u need not be know n. • If the thru is use d to set t he reference p lane, the inser tion phase or electri cal length must be well-known and specif ied.
7- 74 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) F abricating and defining calibration stand ard s for TRL/LRM When cal ibrating a net w ork analyzer , the ac tua l ca l ibration s tandards must have known physical characteristi cs.
7- 75 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) where: f = frequency l = length of l ine v = v elocity = speed of l ight × velocity factor which can be reduced to the follo wi n g.
7- 76 Operating Concept s TRL* /LRM* Cali bration ( ES Models Only) The TRM cali bration tec hnique is related to TRL with the difference b eing that i t bases the charac teristic imp edance of the measurement on a matched Z O terminati on instead of a transmiss ion line f or the thi rd measurement stan d ard.
7- 77 Operati ng Concepts TRL* /LRM* Cali bration (ES Models Onl y) The location of the ref erence plane is determine d by the selec tion of and . By def a ult, the refer enc e pla ne i s set w ith the thru sta ndard whic h must have a known inserti on phase or elec trical leng th.
7- 78 Operating Concept s GPI B Op e ra t ion GPIB Operat i on This sec tion conta i ns infor ma tion on the following t op ics: • l ocal ke y • GPIB control ler modes • instrument a d dresses .
7- 79 Operati ng Concepts GPIB Ope ra t io n GPIB ST A TUS Indicato rs When the anal yzer is con nec ted to ot her instruments over GPIB , the G P IB STA TUS indicator s in the ins trument state function bloc k light up to d isplay the current s tatus of the analyze r .
7- 80 Operating Concept s GPI B Op e ra t ion Address Menu This menu c an be accessed b y pressing the softkey withi n the GPIB menu. In c om m unications through the General Purpos e Inter face Bus (GPIB) , each ins trument on the b us is identi fied by a G P IB address .
7- 81 Operati ng Concepts GPIB Ope ra t io n The GPIO M ode The GPIO mode tur ns the parallel port into a "general p urpose input/o utp ut" por t. In this m od e the por t can be c onnec ted to t est fixtur es, p ow er suppli es, and other peripheral equipment that might be us e d to i nter act with the ana ly zer during measurements .
7- 82 Operating Concept s Limit Line Oper ation Limit Line Operation This menu c an be accessed b y pressing withi n the system menu. Y ou can have limit lines d rawn on the display to represent upper an d lower limits or devic e spec i ficatio ns with which t o compa re the tes t device .
7- 83 Operati ng Concepts Limit Line Oper ation If limit l ines are on, the y are plotted with t he d ata on a plot. If limit testing i s on, the PAS S or FAIL message is plotted, and the failing por tions of the trace tha t are a different col or on the displ ay are also a differ ent color on the plot.
7- 84 Operating Concept s Know ing the I nstrument M odes Knowin g the Instru ment Mod e s There are thre e major instr ument modes of the analy zer : • network analyzer m ode • tuned rec eiver mo.
7- 85 Operati ng Concepts Know ing the I nstrument M odes Fi gu re 7-46 Typical T est Setup for T un ed Receiver Mode Tuned Re ceive r Mo de I n-De pth D es cript ion If you press , the analyz er receiver operates i ndependently of any signal s ource .
7- 86 Operating Concept s Know ing the I nstrument M odes.
8-1 8 Safet y an d Regu latory Infor mati on.
8-2 Saf ety and Regulatory I nf or mation Gene r al Info r mat ion General Inf ormation Maintenance Clean the cabinet, using a dry or d amp cloth only . W ARNI NG T o prevent electrical sh ock, d isc on nect the analyzer fr om m ains before cleanin g.
8- 3 Saf et y and Regulator y Inf orm ation G e ne r a l In for ma t io n T ab le 8-1 C ontact ing Ag ilent Online ass istance: www.agilent.com/f ind/assist Un i ted S tat es (tel) 1 800 452 48 44 Lat.
8-4 Saf ety and Regulatory I nf or mation Sa fety S ym bol s Sa fety Sym b o ls The fol lowing safety symbols are u s ed throughout this manual. F amiliari ze yourself wi th each of the symbol s and its meani ng before op erating thi s instrument . CA UTI ON Cauti on denotes a ha zard.
8- 5 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons Saf ety Cons idera tions NO TE T his instrume nt has been designe d and teste d in accordance w i th IEC Publication 1010, Safety Requirements for Electr onics Measuring Apparatus , and has b een supplied in a s afe conditi on.
8-6 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Servicing W ARNI NG No operator se rviceable parts inside. Refer servic ing to qualified perso nnel. T o pr even t electr ic al s ho ck, do no t r em ove cov e rs. W ARNI NG The se servicin g in stru c t ions a re for use by qualified person n el only .
8- 7 Saf et y and Regulator y Inf orm ation Saf ety C onsi der ati ons General W A RNING T o p revent electrical shock, d isconnect the analyzer from mains before cl eaning. Use a d ry c loth or one slight ly dampened with wat er to clean the exte rn al c ase part s.
8-8 Saf ety and Regulatory I nf or mation Safet y Consi der ati ons Compliance with German FTZ Emissions Requirements This ne twork analyzer compl ies with German F T Z 526/527 Radia ted Emissions a nd Conducted Em ission req uirements .
8- 9 Saf et y and Regulator y Inf orm ation Decl arat i on of Conf ormity Declarat i on of Confo rmity.
8-10 Saf ety and Regulatory I nf or mation Decl arat i on of Conf ormity.
Index In dex - 1 Numerics 2-por t error co rrecti o ns , pe rfor ming , 6-42 , 6- 71 4 Par am Disp lays soft ke y , 1- 18 A aborting a print or pl ot proc ess , 4-33 absolut e ripple t est value , 1-8.
In dex - 2 Index TRL*/LRM * two-por t cal ib ra tio n , 7- 55 cal ib rat ion s tan d ard s , 6- 5 cal ib ra tio n t ech n iqu es improp er , 5- 4 cal i b ra t io n , me a su r em en t , 7-37 cal i b r.
Index In dex - 3 tit lin g , 1- 11 ad ju s t in g co l o rs of th e di spl a y , 1-22 blanking the dis play , 1-21 d a ta tr a ce savin g to di splay mem ory , 1-19 four -channel d isplay 4 P aram Di .
In dex - 4 Index flat limit lines , 1- 73 f loppy dis k, what you can sa ve , 4- 37 form feed se quen ce , 4-26 sending to the printer , 4-2 6 for ma t , 7-8 form at a rray s , 7- 8 for ma t m a rk er.
Index In dex - 5 improving raw sourc e match and load matc h for TRL*/ LRM* cal ibration , 7-7 1 in crea se s weep sp eed using fast 2-port c alib ration , 5-13 increas ing dynamic rang e , 5- 15 incr.
In dex - 6 Index li ne se gmen ts, ed itin g , 1- 78 delet ing line s egments , 1- 78 li ne type s, sel ecting , 4- 17 li near freq uency sweep , 7-1 5 linear magnitude format , 7-27 li near phas e, d.
Index In dex - 7 insert ion pha se response , 1-7 , 1-8 separ ate trans missi o n paths throug h the te s t dev ic e using l ow pass impul s e mo de , 3-20 small signal tr ansient res pon se usi ng lo.
In dex - 8 Index stor ing the HPGL initia lizat ion seq uenc e , 4-25 P pag e quad rants , plotti ng mea sur ements in , 4-30 par am ete rs lowe r st op band , 1-69 me a sur em en t , 1-4 , 1- 68 , 6-.
Index In dex - 9 scale and off set , 7- 8 smoothing , 7-8 sweep- to-swe ep a veragin g , 7- 6 tra ce ma th op eration , 7- 7 tra nsform , 7-8 vect or error -corr ection , 7- 7 pr ocess ing , d ata , 7.
In dex - 10 Index pl a c es wh e r e you ca n sav e , 4-36 what you ca n sa v e t o a com p ute r , 4-37 what you ca n sa v e t o a f loppy disk , 4- 3 7 what you can sa v e to the an alyzer’ s inte.
Index In dex - 11 swept edit lis t menu , 7-17 swept ed it subs weep me nu , 7-17 swept list mode cali brate , 1- 70 charact erist ics of th e filt er , 1- 68 devic e unde r test, conn ect , 1-6 7 me .
In dex - 12 Index creat ing a user -def ine d TRL cal ib rat ion k it , 6- 50 TRL optio ns , 7-76 TRL terminolo gy , 7- 68 TRL* er ror mod el , 7-6 8 TRL*/LRM* cali br at ion , 7-6 7 fabri cating an d.
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